LM2903-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
- Device temperature grade 1: –40°C to 125°C ambient operating temperature range
- Device HBM ESD classification level H1C
- Device CDM ESD classification level C4B
- Improved 2kV HBM ESD for "B" device
- Tri-Temp testing available for "B" device
- Single supply or dual supplies
- Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
- Low input bias current 3.5nA typical ("B" device)
- Low input offset current 0.5nA typical ("B" device)
- Low input offset voltage ±0.37mV typical ("B" device)
- Common-mode input voltage range includes ground
- Differential input voltage range equal to maximum-rated supply voltage ±36 V
- Output compatible with TTL, MOS, and CMOS
- Functional Safety-Capable
The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.
All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.
The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | LM2903-Q1 and LM2903B-Q1 Automotive Dual Comparators datasheet (Rev. M) | PDF | HTML | 2024年 12月 13日 |
Application note | Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. F) | PDF | HTML | 2024年 12月 12日 | |
Functional safety information | LM2903-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA | 2020年 4月 7日 | ||
E-book | The Signal e-book: A compendium of blog posts on op amp design topics | 2017年 3月 28日 | ||
Application note | Designing Overcurrent protection for TPL7407L Peripheral Driver | 2014年 11月 5日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
TIDA-00143 — 汽車 60W 無刷 DC (BLDC) 馬達驅動
TIDA-01445 — 車用高電壓連鎖參考設計
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOIC (D) | 8 | Ultra Librarian |
TSSOP (PW) | 8 | Ultra Librarian |
VSSOP (DGK) | 8 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。