TL441-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- Excellent Dynamic Range
- Wide Bandwidth
- Built-In Temperature Compensation
- Log Linearity (30-dB Sections) . . . 1 dB Typ
- Wide Input Voltage Range
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
This amplifier circuit contains four 30-dB logarithmic stages. Gain in each stage is such that the output of each stage is proportional to the logarithm of the input voltage over the 30-dB input voltage range. Each half of the circuit contains two of these 30-dB stages summed together in one differential output that is proportional to the sum of the logarithms of the input voltages of the two stages. The four stages may be interconnected to obtain a theoretical input voltage range of 120-dB. In practice, this permits the input voltage range typically to be greater than 80-dB with log linearity of ±0.5-dB (see application data). Bandwidth is from dc to 40 MHz.
This circuit is useful in data compression and analog compensation. This logarithmic amplifier is used in log IF circuitry as well as video and log amplifiers.
The TL441M is characterized for operation over the full military temperature range of 55°C to 125°C.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TL441-EP: Logarithmic Amplifier datasheet | 2004年 10月 6日 |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點