現在提供此產品的更新版本
功能相同,但引腳輸出與所比較的裝置不同
TLV1805-Q1
- AEC-Q100 qualified with the following results:
- Device temperature grade 1: –40°C to +125°C ambient operating temperature
- Device HBM ESD Classification Level 2
- Device CDM ESD Classification Level C6
- 3.3 V to 40 V supply range
- Low quiescent current: 135 µA
- High peak current push-pull output
- Rail-to-rail inputs with phase reversal protection
- Built-In hysteresis: 14mV
- 250ns propagation delay
- Low input offset voltage: 500 µV
- Shutdown with high-z output
- Power-On Reset (POR)
- SOT-23-6 package
The TLV1805-Q1 high voltage comparator offers the unique combination of wide supply range, push-pull output, rail-to-rail inputs, low quiescent current, shutdown capability and fast output response. All these features make this comparator well-suited for applications that require sensing at the positive or negative voltage rails such as reverse current protection for a smart diode controller, overcurrent sensing, and overvoltage protection circuits where the push-pull output stage is used to drive the gate of a p-channel or n-channel MOSFET switch.
The high peak current push-pull output stage, which is unique for high-voltage comparators, offers the advantage of allowing the output to actively drive the load to either supply rail with a fast edge rate. This is especially valuable in applications where a MOSFET gate needs to be driven high or low quickly in order to connect or disconnect a host from an unexpected high voltage supply. Additional features such as low input offset voltage, low input bias currents and High-Z shutdown make the TLV1805-Q1 flexible enough to handle a broad range of applications. Power-On reset prevents false outputs at power-up.
The TLV1805-Q1 is AEC-Q100 qualified in a 6-pin SOT-23 package and is specified for operation across the automotive Grade 1 temperature range of –40°C to +125°C.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TLV1805-Q1 40V, Rail-to-Rail Input, Push-Pull Output, High Voltage Automotive Comparator with Shutdown datasheet (Rev. B) | PDF | HTML | 2020年 1月 30日 |
Product overview | Implementing SAE JI772 Pilot Wire System in EV Charging Station With Comparators | PDF | HTML | 2024年 4月 5日 | |
Functional safety information | TLV1805-Q1 Functional Safety, FIT Rate and Failure Mode Distribution | 2020年 3月 17日 | ||
Application note | Overcurrent latch circuit | PDF | HTML | 2019年 8月 9日 | |
Application note | Using Comparators in Reverse Current Applications (Rev. A) | 2019年 6月 11日 | ||
Application note | TLV1805-Q1 EVM ISO Testing Results | 2019年 2月 22日 | ||
Application brief | Overvoltage protection with comparator circuit | PDF | HTML | 2019年 1月 17日 | |
EVM User's guide | TLV1805-Q1EVM Users Manual | 2018年 8月 26日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
TLV1805EVMQ1 — 用於反向電流保護的 TLV1805-Q1 評估模組
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
TIDA-020023 — 具有高精確度電流感測器的汽車正比電磁閥驅動參考設計
PMP21953 — 40-V 隔離式比較器電源供應器參考設計
TIDA-050008 — 具改善電壓監控的 ADAS 電源參考設計
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOT-23 (DBV) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。