SLLA305A May   2010  – September 2023 ESD441 , TPD12S015 , TPD12S015A , TPD12S016 , TPD12S520 , TPD12S521 , TPD13S523 , TPD1E05U06 , TPD1E10B06 , TPD1E10B09 , TPD1E6B06 , TPD1S414 , TPD1S514 , TPD2E001 , TPD2E001-Q1 , TPD2E009 , TPD2E1B06 , TPD2E2U06 , TPD2E2U06-Q1 , TPD2EUSB30 , TPD2EUSB30A , TPD2S017 , TPD3F303 , TPD3S014 , TPD3S044 , TPD4E001 , TPD4E001-Q1 , TPD4E004 , TPD4E02B04 , TPD4E05U06 , TPD4E05U06-Q1 , TPD4E101 , TPD4E1B06 , TPD4E1U06 , TPD4E6B06 , TPD4EUSB30 , TPD4S010 , TPD4S012 , TPD4S014 , TPD4S1394 , TPD4S214 , TPD5E003 , TPD5S115 , TPD5S116 , TPD6E001 , TPD6E004 , TPD6E05U06 , TPD6F002 , TPD6F002-Q1 , TPD6F003 , TPD6F202 , TPD7S019 , TPD8E003 , TPD8F003 , TPD8S009

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Device Summary
  6. 3Pin Configuration and Functions
  7. 4Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 ESD Ratings - JEDEC
    3. 4.3 ESD Ratings - AEC
    4. 4.4 ESD Ratings - IEC
    5. 4.5 ESD Ratings - ISO
    6. 4.6 Recommended Operating Conditions
    7. 4.7 Thermal Information
    8. 4.8 Electrical Characteristics
      1. 4.8.1 Reverse Standoff Voltage (VRWM)
      2. 4.8.2 Breakdown Voltage (VBR)
      3. 4.8.3 Leakage Current (ILEAK)
      4. 4.8.4 Dynamic Resistance (RDYN)
      5. 4.8.5 Line Capacitance (CL)
      6. 4.8.6 Clamping Voltage (VCLAMP)
    9. 4.9 Typical Characteristics
      1. 4.9.1 TLP Plot
      2. 4.9.2 ± 8kV Clamped IEC Waveform
      3. 4.9.3 Capacitance vs. Bias Voltage
      4. 4.9.4 Leakage Current vs. Temperature
      5. 4.9.5 Capacitance vs. Temperature
      6. 4.9.6 Insertion Loss
  8. 5Summary
  9. 6References
  10. 7Revision History

4.8.5 Line Capacitance (CL)

Line capacitance is the result of a diode's depletion region storing electric charge. If the line capacitance is not properly accounted for then the diode can degrade signal integrity. With high speed data applications, a low capacitance is required to maintain signal integrity or the signal can be distorted beyond recognition.