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SN74FB1653

ACTIVO

Transceptores de almacenamiento universal LVTTL/BTL de 17 bits con líneas de reloj con búfer

Detalles del producto

Technology family FB Applications GTL Rating Catalog Operating temperature range (°C) 0 to 70
Technology family FB Applications GTL Rating Catalog Operating temperature range (°C) 0 to 70
HLQFP (PCA) 100 256 mm² 16 x 16
  • Compatible With IEEE Std 1194.1-1991 (BTL)
  • LVTTL A Port, Backplane Transceiver Logic (BTL) B\ Port
  • Open-Collector B\-Port Outputs Sink 100 mA
  • B\-Port Biasing Network Preconditions the Connector and PC Trace to the BTL High-Level Voltage
  • High-Impedance State During Power Up and Power Down
  • Selectable Clock Delay
  • TTL-Input Structures Incorporate Active Clamping Networks to Aid in Line Termination
  • BIAS VCC Minimizes Signal Distortion During Live Insertion/Withdrawal

  • Compatible With IEEE Std 1194.1-1991 (BTL)
  • LVTTL A Port, Backplane Transceiver Logic (BTL) B\ Port
  • Open-Collector B\-Port Outputs Sink 100 mA
  • B\-Port Biasing Network Preconditions the Connector and PC Trace to the BTL High-Level Voltage
  • High-Impedance State During Power Up and Power Down
  • Selectable Clock Delay
  • TTL-Input Structures Incorporate Active Clamping Networks to Aid in Line Termination
  • BIAS VCC Minimizes Signal Distortion During Live Insertion/Withdrawal

The SN74FB1653 contains an 8-bit and a 9-bit transceiver with a buffered clock. The clock and transceivers are designed to translate signals between LVTTL and BTL environments. The device is designed specifically to be compatible with IEEE Std 1194.1-1991 (BTL).

The A port operates at LVTTL signal levels. The A outputs reflect the inverse of the data at the B\ port when the A-port output enable (OEA) is high. When OEA is low or when VCC(5 V) typically is less than 2.5 V, the A outputs are in the high-impedance state.

The B\ port operates at BTL signal levels. The open-collector B\ ports are specified to sink 100 mA. Two output enables (OEB and OEB)\ are provided for the B\ outputs. When OEB is low, OEB\ is high, or VCC(5 V) typically is less than 2.5 V, the B port is turned off.

The clock-select (2SEL1 and 2SEL2) inputs are used to configure the TTL-to-BTL clock paths and delays (refer to the MUX-MODE DELAY table).

BIAS VCC establishes a voltage between 1.62 V and 2.1 V on the BTL outputs when VCC(5 V) is not connected.

BG VCC and BG GND are the supply inputs for the bias generator.

VREF is an internally generated voltage source. It is recommended that VREF be decoupled with a 0.1-µF capacitor.

Enhanced heat-dissipation techniques should be used when operating this device from AI to A0 at frequencies greater than 50 MHz, or from AI to B\ or B\ to A0 at frequencies greater than 100 MHz.

The SN74FB1653 contains an 8-bit and a 9-bit transceiver with a buffered clock. The clock and transceivers are designed to translate signals between LVTTL and BTL environments. The device is designed specifically to be compatible with IEEE Std 1194.1-1991 (BTL).

The A port operates at LVTTL signal levels. The A outputs reflect the inverse of the data at the B\ port when the A-port output enable (OEA) is high. When OEA is low or when VCC(5 V) typically is less than 2.5 V, the A outputs are in the high-impedance state.

The B\ port operates at BTL signal levels. The open-collector B\ ports are specified to sink 100 mA. Two output enables (OEB and OEB)\ are provided for the B\ outputs. When OEB is low, OEB\ is high, or VCC(5 V) typically is less than 2.5 V, the B port is turned off.

The clock-select (2SEL1 and 2SEL2) inputs are used to configure the TTL-to-BTL clock paths and delays (refer to the MUX-MODE DELAY table).

BIAS VCC establishes a voltage between 1.62 V and 2.1 V on the BTL outputs when VCC(5 V) is not connected.

BG VCC and BG GND are the supply inputs for the bias generator.

VREF is an internally generated voltage source. It is recommended that VREF be decoupled with a 0.1-µF capacitor.

Enhanced heat-dissipation techniques should be used when operating this device from AI to A0 at frequencies greater than 50 MHz, or from AI to B\ or B\ to A0 at frequencies greater than 100 MHz.

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Documentación técnica

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* Data sheet SN74FB1653 datasheet (Rev. H) 10 mar 2004
Application note Schematic Checklist - A Guide to Designing with Auto-Bidirectional Translators PDF | HTML 12 jul 2024
Application note Understanding Transient Drive Strength vs. DC Drive Strength in Level-Shifters (Rev. A) PDF | HTML 03 jul 2024
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 jul 2021
Selection guide Voltage Translation Buying Guide (Rev. A) 15 abr 2021
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 ago 2002
Application note Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices 10 may 2002
Selection guide Advanced Bus Interface Logic Selection Guide 09 ene 2001
Application note GTL/BTL: A Low-Swing Solution for High-Speed Digital Logic (Rev. A) 01 mar 1997
Application note Next-Generation BTL/Futurebus Transceivers Allow Single-Sided SMT Manufacturing (Rev. C) 01 mar 1997
Application note Understanding Advanced Bus-Interface Products Design Guide 01 may 1996

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Modelo de simulación

SN74FB1653 IBIS Model (Rev. C)

SCBM012C.ZIP (26 KB) - IBIS Model
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
HLQFP (PCA) 100 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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