홈 증폭기 연산 증폭기 (op amps) 범용 연산 증폭기
홈
증폭기
연산 증폭기 (op amps)
범용 연산 증폭기

TLE2144-EP

활성

EP(Enhanced Product) Excaliber 저잡음 고속 정밀 쿼드 연산 증폭기

지금 주문
데이터 시트

이 제품의 최신 버전이 있습니다

open-in-new 대안 비교
비교 대상 장치보다 업그레이드된 기능을 지원하는 드롭인 대체품
OPA4991-EP 활성 향상된 제품, 쿼드, 40V, 4.5MHz, 레일 투 레일 입력/출력 연산 증폭기 Rail-to-rail I/O, wider supply range (2.7 V to 40 V), higher gain bandwidth (4.5 MHz), faster slew rate (21 V/µs), lower offset voltage (0.895 mV), lower power (0.56 mA), higher output current (75 mA)

TLE2144-EP

활성
데이터 시트 지금 주문

제품 상세 정보

Number of channels 4 Total supply voltage (+5 V = 5, ±5 V = 10) (max) (V) 44 Total supply voltage (+5 V = 5, ±5 V = 10) (min) (V) 4 Rail-to-rail In to V- GBW (typ) (MHz) 6 Slew rate (typ) (V/µs) 45 Vos (offset voltage at 25°C) (max) (mV) 2.4 Iq per channel (typ) (mA) 3.45 Vn at 1 kHz (typ) (nV√Hz) 10.5 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Offset drift (typ) (µV/°C) 1.7 Features High Cload Drive Input bias current (max) (pA) 1500000 CMRR (typ) (dB) 108 Iout (typ) (A) 0.031 Architecture Bipolar Input common mode headroom (to negative supply) (typ) (V) -0.3 Input common mode headroom (to positive supply) (typ) (V) -1.8 Output swing headroom (to negative supply) (typ) (V) 0.1 Output swing headroom (to positive supply) (typ) (V) -0.8
Number of channels 4 Total supply voltage (+5 V = 5, ±5 V = 10) (max) (V) 44 Total supply voltage (+5 V = 5, ±5 V = 10) (min) (V) 4 Rail-to-rail In to V- GBW (typ) (MHz) 6 Slew rate (typ) (V/µs) 45 Vos (offset voltage at 25°C) (max) (mV) 2.4 Iq per channel (typ) (mA) 3.45 Vn at 1 kHz (typ) (nV√Hz) 10.5 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 Offset drift (typ) (µV/°C) 1.7 Features High Cload Drive Input bias current (max) (pA) 1500000 CMRR (typ) (dB) 108 Iout (typ) (A) 0.031 Architecture Bipolar Input common mode headroom (to negative supply) (typ) (V) -0.3 Input common mode headroom (to positive supply) (typ) (V) -1.8 Output swing headroom (to negative supply) (typ) (V) 0.1 Output swing headroom (to positive supply) (typ) (V) -0.8
SOIC (DW) 16 106.09 mm² 10.3 x 10.3
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Low Noise
    • 10 Hz...15 nV/Hz
    • 1 kHz...10.5 nV/Hz
  • 10 000-pF Load Capability
  • 20-mA (Min) Short-Circuit Output Current
  • 27-V/µs Slew Rate (Min)
  • High Gain-Bandwidth Product...5.9 MHz
  • Low VIO...900 &microV (Max) at 25°C
  • Single or Split Supply...4 V to 44 V
  • Fast Settling Time
    • 340 ns to 0.1%
    • 400 ns to 0.01%
  • Saturation Recovery...150 ns
  • Large Output Swing...VCC– + 0.1 V to VCC+ – 1 V

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to Highly Accelerated Stress Test (HAST)or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specificed performance and environmental limits.
Excalibur is a trademark of Texas Instruments.
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Low Noise
    • 10 Hz...15 nV/Hz
    • 1 kHz...10.5 nV/Hz
  • 10 000-pF Load Capability
  • 20-mA (Min) Short-Circuit Output Current
  • 27-V/µs Slew Rate (Min)
  • High Gain-Bandwidth Product...5.9 MHz
  • Low VIO...900 &microV (Max) at 25°C
  • Single or Split Supply...4 V to 44 V
  • Fast Settling Time
    • 340 ns to 0.1%
    • 400 ns to 0.01%
  • Saturation Recovery...150 ns
  • Large Output Swing...VCC– + 0.1 V to VCC+ – 1 V

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to Highly Accelerated Stress Test (HAST)or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specificed performance and environmental limits.
Excalibur is a trademark of Texas Instruments.

The TLE214x devices are high-performance, internally compensated operational amplifiers built using the Texas Instruments complementary bipolar Excalibur. process. They are pin-compatible upgrades to standard industry products.

The design incorporates an input stage that simultaneously achieves low audio-band noise of 10.5 nV//100-pF load is useful in fast actuator/positioning drivers. Under similar test conditions, settling time to 0.01% is 400 ns.

The devices are stable with capacitive loads up to 10 nF, although the 6-MHz bandwidth decreases to 1.8 MHz at this high loading level. As such, the TLE214x are useful for low-droop sample-and-holds and direct buffering of long cables, including 4-mA to 20-mA current loops.

The special design also exhibits an improved insensitivity to inherent integrated circuit component mismatches as is evidenced by a 900-µV maximum offset voltage and 1.7-µV/°C typical drift. Minimum common-mode rejection ratio and supply-voltage rejection ratio are 85 dB and 90 dB, respectively.

Device performance is relatively independent of supply voltage over the ±2-V to ±22-V range. Inputs can operate between VCC– – 0.3 V to VCC+ – 1.8 V without inducing phase reversal, although excessive input current may flow out of each input exceeding the lower common-mode input range. The all-npn output stage provides a nearly rail-to-rail output swing of VCC– – 0.1 V to VCC+ – 1 V under light current-loading conditions. The device can sustain shorts to either supply since output current is internally limited, but care must be taken to ensure that maximum package power dissipation is not exceeded.

Both versions can also be used as comparators. Differential inputs of VCC± can be maintained without damage to the device. Open-loop propagation delay with TTL supply levels is typically 200 ns. This gives a good indication as to output stage saturation recovery when the device is driven beyond the limits of recommended output swing.

The TLE214x devices are available in industry-standard 8-pin and 16-pin small-outline packages. The devices are characterized for operation from –55°C to 125°C.

The TLE214x devices are high-performance, internally compensated operational amplifiers built using the Texas Instruments complementary bipolar Excalibur. process. They are pin-compatible upgrades to standard industry products.

The design incorporates an input stage that simultaneously achieves low audio-band noise of 10.5 nV//100-pF load is useful in fast actuator/positioning drivers. Under similar test conditions, settling time to 0.01% is 400 ns.

The devices are stable with capacitive loads up to 10 nF, although the 6-MHz bandwidth decreases to 1.8 MHz at this high loading level. As such, the TLE214x are useful for low-droop sample-and-holds and direct buffering of long cables, including 4-mA to 20-mA current loops.

The special design also exhibits an improved insensitivity to inherent integrated circuit component mismatches as is evidenced by a 900-µV maximum offset voltage and 1.7-µV/°C typical drift. Minimum common-mode rejection ratio and supply-voltage rejection ratio are 85 dB and 90 dB, respectively.

Device performance is relatively independent of supply voltage over the ±2-V to ±22-V range. Inputs can operate between VCC– – 0.3 V to VCC+ – 1.8 V without inducing phase reversal, although excessive input current may flow out of each input exceeding the lower common-mode input range. The all-npn output stage provides a nearly rail-to-rail output swing of VCC– – 0.1 V to VCC+ – 1 V under light current-loading conditions. The device can sustain shorts to either supply since output current is internally limited, but care must be taken to ensure that maximum package power dissipation is not exceeded.

Both versions can also be used as comparators. Differential inputs of VCC± can be maintained without damage to the device. Open-loop propagation delay with TTL supply levels is typically 200 ns. This gives a good indication as to output stage saturation recovery when the device is driven beyond the limits of recommended output swing.

The TLE214x devices are available in industry-standard 8-pin and 16-pin small-outline packages. The devices are characterized for operation from –55°C to 125°C.
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기술 자료

star =TI에서 선정한 이 제품의 인기 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
3개 모두 보기
유형 직함 날짜
* Data sheet Excaliber Low-Noise High-Speed Precision Operational Amplifier datasheet 2008/05/13
* Radiation & reliability report TLE2144MDWREP Reliability Report 2016/02/09
E-book The Signal e-book: A compendium of blog posts on op amp design topics 2017/03/28

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

계산 툴

ANALOG-ENGINEER-CALC — 아날로그 엔지니어의 계산기

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설계 툴

CIRCUIT060013 — T-네트워크 피드백 회로가 있는 인버팅 증폭기

이 설계는 입력 신호 VIN을 반전하고 1,000V/V 또는 60dB의 신호 게인을 적용합니다. T-피드백 네트워크가 있는 인버팅 증폭기는 R4에 대한 작은 값 없이 높은 게인이나 피드백 레지스터에 대해 매우 큰 값을 얻는 데 사용할 수 있습니다.
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설계 툴

CIRCUIT060015 — 조정 가능한 레퍼런스 전압 회로

이 회로는 인버팅 및 비인버팅 증폭기를 결합하여 입력 전압의 음극부터 입력 전압까지 레퍼런스 전압을 조정할 수 있도록 합니다. 게인을 추가하여 최대 음극 레퍼런스 레벨을 높일 수 있습니다.
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설계 툴

CIRCUIT060074 — 콤퍼레이터 회로를 사용한 고압측 전류 감지

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시뮬레이션 툴

PSPICE-FOR-TI — TI 설계 및 시뮬레이션 툴용 PSpice®

TI용 PSpice®는 아날로그 회로의 기능을 평가하는 데 사용되는 설계 및 시뮬레이션 환경입니다. 완전한 기능을 갖춘 이 설계 및 시뮬레이션 제품군은 Cadence®의 아날로그 분석 엔진을 사용합니다. 무료로 제공되는 TI용 PSpice에는 아날로그 및 전력 포트폴리오뿐 아니라 아날로그 행동 모델에 이르기까지 업계에서 가장 방대한 모델 라이브러리 중 하나가 포함되어 있습니다.

TI 설계 및 시뮬레이션 환경용 PSpice는 기본 제공 라이브러리를 이용해 복잡한 혼합 신호 설계를 시뮬레이션할 수 있습니다. 레이아웃 및 제작에 (...)
요청
시뮬레이션 툴

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사용 설명서: PDF
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패키지 핀 CAD 기호, 풋프린트 및 3D 모델
SOIC (DW) 16 Ultra Librarian
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주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

TI 엔지니어의 기술 지원을 받을 수 있는 TI E2E™ 포럼

포럼 주제 모두 보기(영문)

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