CY74FCT2543T

ACTIVO

Transceptores registrados de bus octal con salidas de 3 estados y resistencias de amortiguación seri

Detalles del producto

Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 8 IOL (max) (mA) 12 IOH (max) (mA) -15 Input type TTL Output type TTL Features Damping resistors, Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family FCT Rating Catalog Operating temperature range (°C) -40 to 85
Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Number of channels 8 IOL (max) (mA) 12 IOH (max) (mA) -15 Input type TTL Output type TTL Features Damping resistors, Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family FCT Rating Catalog Operating temperature range (°C) -40 to 85
SOIC (DW) 24 159.65 mm² 15.5 x 10.3 SSOP (DBQ) 24 51.9 mm² 8.65 x 6
  • Function and Pinout Compatible With FCT and F Logic
  • 25-Output Series Resistors to Reduce Transmission-Line Reflection Noise
  • Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • Fully Compatible With TTL Input and Output Logic Levels
  • 12-mA Output Sink Current
    15-mA Output Source Current
  • Separation Controls for Data Flow in Each Direction
  • Back-to-Back Latches for Storage
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • 3-State Outputs

  • Function and Pinout Compatible With FCT and F Logic
  • 25-Output Series Resistors to Reduce Transmission-Line Reflection Noise
  • Reduced VOH (Typically = 3.3 V) Versions of Equivalent FCT Functions
  • Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics
  • Ioff Supports Partial-Power-Down Mode Operation
  • Matched Rise and Fall Times
  • Fully Compatible With TTL Input and Output Logic Levels
  • 12-mA Output Sink Current
    15-mA Output Source Current
  • Separation Controls for Data Flow in Each Direction
  • Back-to-Back Latches for Storage
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)
  • 3-State Outputs

The CY74FCT2543T octal latched transceiver contains two sets of eight D-type latches. Separate latch enable (LEAB\, LEBA\) and output enable (OEAB\, OEBA\) inputs permit each latch set to have independent control of inputting and outputting in either direction of data flow. For example, for data flow from A to B, the A-to-B enable (CEAB\) input must be low to enter data from A or to take data from B, as indicated in the function table. With CEAB\ low, a low signal on the A-to-B latch enable (LEAB\) input makes the A-to-B latches transparent; a subsequent low-to-high transition of LEAB\ puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB\ and OEAB\ both low, the 3-state B output buffers are active and reflect data present at the output of the A latches. Control of data from B to A is similar, but uses CEAB\, LEAB\, and OEAB\ inputs. On-chip termination resistors at the outputs reduce system noise caused by reflections. The CY74FCT2543T can replace the CY74FCT543T to reduce noise in an existing design.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The CY74FCT2543T octal latched transceiver contains two sets of eight D-type latches. Separate latch enable (LEAB\, LEBA\) and output enable (OEAB\, OEBA\) inputs permit each latch set to have independent control of inputting and outputting in either direction of data flow. For example, for data flow from A to B, the A-to-B enable (CEAB\) input must be low to enter data from A or to take data from B, as indicated in the function table. With CEAB\ low, a low signal on the A-to-B latch enable (LEAB\) input makes the A-to-B latches transparent; a subsequent low-to-high transition of LEAB\ puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB\ and OEAB\ both low, the 3-state B output buffers are active and reflect data present at the output of the A latches. Control of data from B to A is similar, but uses CEAB\, LEAB\, and OEAB\ inputs. On-chip termination resistors at the outputs reduce system noise caused by reflections. The CY74FCT2543T can replace the CY74FCT543T to reduce noise in an existing design.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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Documentación técnica

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Tipo Título Fecha
* Data sheet 8-Bit Latched Transceiver With 3-State Outputs datasheet (Rev. C) 02 nov 2001
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note Selecting the Right Level Translation Solution (Rev. A) 22 jun 2004
User guide CYFCT Parameter Measurement Information 02 abr 2001
Selection guide Advanced Bus Interface Logic Selection Guide 09 ene 2001

Diseño y desarrollo

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Placa de evaluación

14-24-LOGIC-EVM — Módulo de evaluación genérico de productos lógicos para encapsulados D, DB, DGV, DW, DYY, NS y PW de

El módulo de evaluación 14-24-LOGIC-EVM (EVM) está diseñado para admitir cualquier dispositivo lógico que esté en un encapsulado D, DW, DB, NS, PW, DYY o DGV de 14 a 24 pines.

Guía del usuario: PDF | HTML
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (DW) 24 Ultra Librarian
SSOP (DBQ) 24 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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