SN65HVD11-HT
- Operates With a 3.3-V Supply
- Bus-Pin ESD Protection Exceeds 16-kV Human-
Body Model (HBM) - 1/8 Unit-Load Option Available (up to 256 Nodes
on Bus) - Optional Driver Output Transition Times for
Signaling Rates(1) of 1 Mbps, 10 Mbps,
and 32 Mbps - Based on ANSI TIA/EIA-485-A
- Bus-Pin Short Circuit Protection From
–7 V to 12 V - Open-Circuit, Idle-Bus, and Shorted-Bus Fail-Safe
Receiver - Glitch-Free Power-Up and Power-Down Protection
for Hot-Plugging Applications - SN75176 Footprint
- Supports Extreme Temperature Applications:
- Controlled Baselines
- One Assembly and Test Sites
- One Fabrication Sites
- Available in Extreme (–55°C/210°C)
Temperature Range(2) - Extended Product Life Cycles
- Extended Product-Change Notifications
- Product Traceability
- Texas Instruments’ High Temperature
Products Use Highly Optimized Silicon (Die)
Solutions With Design and Process
Enhancements to Maximize Performance Over
Extended Temperatures.
The SN65HVD11-HT device combines a 3-state differential line driver and differential input line receiver that operates with a single 3.3-V power supply. It is designed for balanced transmission lines and meets or exceeds ANSI TIA/EIA-485-A and ISO 8482:1993, with the exception that the thermal shutdown is removed. This differential bus transceiver is a monolithic integrated circuit designed for bidirectional data communication on multipoint bus-transmission lines. The driver and receiver have active-high and active-low enables, respectively, that can be externally connected together to function as direction control.
The driver differential outputs and receiver differential inputs connect internally to form a differential input/ output (I/O) bus port that is designed to offer minimum loading to the bus when the driver is disabled or VCC = 0.
技術資料
| 種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
|---|---|---|---|---|---|---|
| * | データシート | SN65HVD11-HT 3.3-V RS-485 Transceiver データシート (Rev. F) | PDF | HTML | 2015年 11月 30日 | ||
| * | 放射線と信頼性レポート | SN65HVD11HKJ_HKQ Reliability Reports | 2012年 9月 20日 | |||
| * | 放射線と信頼性レポート | SN65HVD11JD Reliability Report | 2012年 9月 20日 | |||
| * | 放射線と信頼性レポート | SN65HVD11HD Reliability Report (Rev. A) | 2012年 8月 17日 |
購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点