LF198JAN-SP
- Operates from ±5V to ±18V Supplies
- Less Than 10 μs Acquisition Time
- TTL, PMOS, CMOS Compatible Logic Input
- 0.5 mV Typical Hold Step at Ch = 0.01 μF
- Low Input Offset
- 0.002% Gain Accuracy
- Low Output Noise in Hold Mode
- Input Characteristics Do Not Change During Hold Mode
- High Supply Rejection Ratio in Sample or Hold
- Wide Bandwidth
- Space Qualified
Logic Inputs on the LF198 are Fully Differential with Low Input Current, Allowing Direct Connection to TTL, PMOS, and CMOS. Differential Threshold is 1.4V. The LF198 will Operate from ±5V to ±18V Supplies.
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The LF198 is a monolithic sample-and-hold circuit which utilizes BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate. Operating as a unity gain follower, dc gain accuracy is 0.002% typical and acquisition time is as low as 6 μs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does not degrade input offset drift. The wide bandwidth allows the LF198 to be included inside the feedback loop of 1 MHz op amps without having stability problems. Input impedance of 1010Ω allows high source impedances to be used without degrading accuracy.
P-channel junction FET's are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1 μF hold capacitor. The JFET's have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feed-through from input to output in the hold mode, even for input signals equal to the supply voltages.
技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | LF198JAN Monolithic Sample-and-Hold Circuits datasheet (Rev. A) | 2013年 3月 20日 | |
| Application brief | DLA Approved Optimizations for QML Products (Rev. B) | PDF | HTML | 2024年 5月 17日 | |
| Selection guide | TI Space Products (Rev. J) | 2024年 2月 12日 | ||
| More literature | TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) | 2023年 8月 31日 | ||
| Application note | Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) | PDF | HTML | 2022年 11月 17日 | |
| Application note | Single-Event Effects Confidence Interval Calculations (Rev. A) | PDF | HTML | 2022年 10月 19日 |
設計與開發
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PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TO-CAN (LMC) | 8 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點