LM57-Q1

現行

具有電阻可編程溫度開關的車規、±0.7°C 溫度感測器

立即訂購

產品規格表

document-pdfAcrobat LM57-Q1 Resistor-Programmable Temperature Switch and Analog Temperature Sensor datasheet (Rev. A) (英文) PDF | HTML

LM57-Q1

現行

產品規格表

立即訂購

產品詳細資料

Setpoint type

Resistor Programmable

Setpoint value (°C)

-40 to 160

Operating temperature range (°C)

-50 to 160

Accuracy over temp range (max) (°C)

1.3

Sensor gain (mV/°C)

-12.924, -10.339, -7.752, -5.166

Output type

Open drain, Push Pull

Supply voltage (min) (V)

2.4

Supply voltage (max) (V)

5.5

Supply current (typ) (µA)

24

Number of comparator channels

1

Features

Built-in hysteresis, Trip-Test Pin

Rating

Automotive

Interface type

Analog output, Switch

Setpoint type

Resistor Programmable

Setpoint value (°C)

-40 to 160

Operating temperature range (°C)

-50 to 160

Accuracy over temp range (max) (°C)

1.3

Sensor gain (mV/°C)

-12.924, -10.339, -7.752, -5.166

Output type

Open drain, Push Pull

Supply voltage (min) (V)

2.4

Supply voltage (max) (V)

5.5

Supply current (typ) (µA)

24

Number of comparator channels

1

Features

Built-in hysteresis, Trip-Test Pin

Rating

Automotive

Interface type

Analog output, Switch

TSSOP (PW)

8

19.2 mm² 3 x 6.4

Qualified for Automotive Applications, for
Commercial Device See LM57 Data Sheet
AEC-Q100 Qualified with the Following Results:
- Temperature Grade 0 Extended: −50°C to
  +160°C with Excursions up to 170°C Operating
  Temperature Range
- Temperature Grade 0: −50°C to +150°C
  Operating Temperature Range
- Temperature Grade 1: −50°C to +125°C
  Operating Temperature Range
- HBM ESD Component Classification Level 2
- CDM ESD Component Classification Level C5
Trip Temperature Set by External Resistors with
Accuracy of ±2.3°C from −40°C to +150°C
Resistor Tolerance Contributes Zero Error
Push-Pull and Open-Drain Switch Outputs
Wide Operating Temperature Range of −50°C to
160°C
Very Linear Analog V_TEMP Temp Sensor Output
with ±1.3°C Accuracy from −50°C to +150°C
Short-Circuit Protected Analog and Digital Outputs
Latching Function for Digital Outputs
TRIP-TEST Pin Allows In-System Testing
Low Power Minimizes Self-Heating to Under 0.02°C

Qualified for Automotive Applications, for
Commercial Device See LM57 Data Sheet
AEC-Q100 Qualified with the Following Results:
- Temperature Grade 0 Extended: −50°C to
  +160°C with Excursions up to 170°C Operating
  Temperature Range
- Temperature Grade 0: −50°C to +150°C
  Operating Temperature Range
- Temperature Grade 1: −50°C to +125°C
  Operating Temperature Range
- HBM ESD Component Classification Level 2
- CDM ESD Component Classification Level C5
Trip Temperature Set by External Resistors with
Accuracy of ±2.3°C from −40°C to +150°C
Resistor Tolerance Contributes Zero Error
Push-Pull and Open-Drain Switch Outputs
Wide Operating Temperature Range of −50°C to
160°C
Very Linear Analog V_TEMP Temp Sensor Output
with ±1.3°C Accuracy from −50°C to +150°C
Short-Circuit Protected Analog and Digital Outputs
Latching Function for Digital Outputs
TRIP-TEST Pin Allows In-System Testing
Low Power Minimizes Self-Heating to Under 0.02°C

The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (T_TRIP) is selected from 256 possible values in the range of –40°C to 160°C. The V_TEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the T_TRIP and V_TEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (T_HYST) prevents the digital outputs from oscillating. The T_OVER and T_OVER digital outputs will assert when the die temperature exceeds T_TRIP and will de-assert when the temperature falls below a temperature equal to T_TRIP minus T_HYST.

T_OVER is active-high with a push-pull structure. T_OVER is active-low with an open-drain structure. Tying T_OVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of T_OVER or T_OVER , confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the V_TEMP pin. The system could then use this voltage to calculate the threshold of the LM57-Q1.

The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (T_TRIP) is selected from 256 possible values in the range of –40°C to 160°C. The V_TEMP is a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the T_TRIP and V_TEMP slope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (T_HYST) prevents the digital outputs from oscillating. The T_OVER and T_OVER digital outputs will assert when the die temperature exceeds T_TRIP and will de-assert when the temperature falls below a temperature equal to T_TRIP minus T_HYST.

T_OVER is active-high with a push-pull structure. T_OVER is active-low with an open-drain structure. Tying T_OVER to TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of T_OVER or T_OVER , confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the V_TEMP pin. The system could then use this voltage to calculate the threshold of the LM57-Q1.