인터페이스 기타 인터페이스

SCAN921224

활성

20~66MHz 10비트 디시리얼라이저(IEEE 1149.1 테스트 액세스 지원)

제품 상세 정보

Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 85
Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 85
NFBGA (NZA) 49 49 mm² 7 x 7
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery From PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 500 mW (typ) @ 66 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • Flow-Through Pinout for Easy PCB Layout
  • 660 Mbps Serial Bus LVDS Data Rate (at 66 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs when Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery From PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 500 mW (typ) @ 66 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • Flow-Through Pinout for Easy PCB Layout
  • 660 Mbps Serial Bus LVDS Data Rate (at 66 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs when Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921224 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and the optional Test Reset (TRST). IEEE 1149.1 features provide the designer or test engineer access to the backplane or cable interconnects and the ability to verify differential signal integrity to enhance their system test strategy. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921023 transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921023 output pins into TRI-STATE to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 66 MHz.

The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921224 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and the optional Test Reset (TRST). IEEE 1149.1 features provide the designer or test engineer access to the backplane or cable interconnects and the ability to verify differential signal integrity to enhance their system test strategy. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921023 transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921023 output pins into TRI-STATE to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 66 MHz.

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기술 자료

star =TI에서 선정한 이 제품의 인기 문서
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2개 모두 보기
유형 직함 날짜
* Data sheet 20-66MHz 10Bit Bus LVDS Serial & Deserial w/IEEE 1149.1 (JTAG) & at-speed BIST datasheet (Rev. D) 2013/04/15
Application note DS15BA101 & DS15EA101 Enable Long Reach Applications for Embedded Clock SER/DES (Rev. E) 2013/04/29

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사용 설명서: PDF
패키지 CAD 기호, 풋프린트 및 3D 모델
NFBGA (NZA) 49 Ultra Librarian

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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