現在提供此產品的更新版本
可直接投入的替代產品,相較於所比較的裝置,具備升級功能
LF356
- Advantages
- Replace Expensive Hybrid and Module FET
Op Amps - Rugged JFETs Allow Blow-Out Free Handling
Compared With MOSFET Input Devices - Excellent for Low Noise Applications Using
Either High or Low Source Impedance–Very
Low 1/f Corner - Offset Adjust Does Not Degrade Drift or
Common-Mode Rejection as in Most
Monolithic Amplifiers - New Output Stage Allows Use of Large
Capacitive Loads (5,000 pF) Without Stability
Problems - Internal Compensation and Large Differential
Input Voltage Capability
- Replace Expensive Hybrid and Module FET
- Common Features
- Low Input Bias Current: 30 pA
- Low Input Offset Current: 3 pA
- High Input Impedance: 1012 Ω
- Low Input Noise Current: 0.01 pA/√Hz
- High Common-Mode Rejection Ratio: 100 dB
- Large DC Voltage Gain: 106 dB
- Uncommon Features
- Extremely Fast Settling Time to 0.01%:
- 4 µs for the LFx55 devices
- 1.5 µs for the LFx56
- 1.5 µs for the LFx57 (AV = 5)
- Fast Slew Rate:
- 5 V/µs for the LFx55
- 12 V/µs for the LFx56
- 50 V/µs for the LFx57 (AV = 5)
- Wide Gain Bandwidth:
- 2.5 MHz for the LFx55 devices
- 5 MHz for the LFx56
- 20 MHz for the LFx57 (AV = 5)
- Low Input Noise Voltage:
- 20 nV/√Hz for the LFx55
- 12 nV/√Hz for the LFx56
- 12 nV/√Hz for the LFx57 (AV = 5)
- Extremely Fast Settling Time to 0.01%:
The LFx5x devices are the first monolithic JFET input operational amplifiers to incorporate well-matched, high-voltage JFETs on the same chip with standard bipolar transistors (BI-FET™ Technology). These amplifiers feature low input bias and offset currents/low offset voltage and offset voltage drift, coupled with offset adjust, which does not degrade drift or common-mode rejection. The devices are also designed for high slew rate, wide bandwidth, extremely fast settling time, low voltage and current noise and a low 1/f noise corner.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | LFx5x JFET Input Operational Amplifiers datasheet (Rev. D) | PDF | HTML | 2015年 11月 30日 |
E-book | The Signal e-book: A compendium of blog posts on op amp design topics | 2017年 3月 28日 | ||
Application note | AN-272 Op Amp Booster Designs (Rev. B) | 2013年 4月 23日 | ||
Application note | AN-263 Sine Wave Generation Techniques (Rev. C) | 2013年 4月 22日 | ||
Application note | Effect of Heavy Loads on Accuracy and Linearity of Op Amp Circuits (Rev. B) | 2013年 4月 22日 | ||
Application note | Data Acq Using ADC0816 & ADC0817 8-Bit ADC w/On-Chip 16 Chan Multiplexr | 2004年 5月 10日 | ||
Application note | AN-293 Control Applications of CMOS DACs | 2004年 5月 10日 | ||
Application note | AN-253 LH0024 and LH0032 High Speed Op Amp Applications | 2004年 5月 2日 | ||
Application note | AN-275 CMOS D/A Converters Match Most Microprocessors | 2004年 5月 2日 | ||
Application note | AN-447 Protection Schemes for BI-FET Amplifiers and Switches | 2004年 5月 2日 | ||
Application note | Get Fast Stable Response From Improved Unity-Gain Followers | 2002年 10月 2日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
DIP-ADAPTER-EVM — DIP 轉接器評估模組
Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and inexpensive way to interface with small, surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them directly to existing circuits.
The (...)
ANALOG-ENGINEER-CALC — 類比工程師計算機
CIRCUIT060013 — 具有 T 網路回饋電路的反相放大器
CIRCUIT060074 — 具有比較器電路的高壓側電流感測
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
PDIP (P) | 8 | Ultra Librarian |
SOIC (D) | 8 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點