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放大器
運算放大器 (op amps)
一般用途運算放大器
首頁
放大器
運算放大器 (op amps)
一般用途運算放大器

MC3303

現行

四路、30-V、1-MHz 運算放大器

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產品規格表

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LM324B 現行 四路、36V 1.2MHz 3mV 補償電壓運算放大器 Wider supply range (3 V to 36 V), higher GBW (1.2 MHz), lower offset voltage (3 mV), lower power (0.175 mA), higher output current (40 mA)
TLV9304 現行 四通道、40-V、1-MHz、低功耗 (0.15 mA) 運算放大器 Lower offset voltage (2.5 mV) and higher slew rate (3.5 V/us) for your cost-optimized applications

MC3303

現行
產品規格表 立即訂購

產品詳細資料

Number of channels 4 Total supply voltage (+5 V = 5, ±5 V = 10) (max) (V) 30 Total supply voltage (+5 V = 5, ±5 V = 10) (min) (V) 5 Rail-to-rail In to V- GBW (typ) (MHz) 1 Slew rate (typ) (V/µs) 0.6 Vos (offset voltage at 25°C) (max) (mV) 8 Iq per channel (typ) (mA) 0.7 Rating Catalog Operating temperature range (°C) -40 to 85 Offset drift (typ) (µV/°C) 10 Input bias current (max) (pA) 500000 CMRR (typ) (dB) 90 Iout (typ) (A) 0.03 Architecture Bipolar Input common mode headroom (to negative supply) (typ) (V) 0 Input common mode headroom (to positive supply) (typ) (V) -3 Output swing headroom (to negative supply) (typ) (V) 3 Output swing headroom (to positive supply) (typ) (V) -3
Number of channels 4 Total supply voltage (+5 V = 5, ±5 V = 10) (max) (V) 30 Total supply voltage (+5 V = 5, ±5 V = 10) (min) (V) 5 Rail-to-rail In to V- GBW (typ) (MHz) 1 Slew rate (typ) (V/µs) 0.6 Vos (offset voltage at 25°C) (max) (mV) 8 Iq per channel (typ) (mA) 0.7 Rating Catalog Operating temperature range (°C) -40 to 85 Offset drift (typ) (µV/°C) 10 Input bias current (max) (pA) 500000 CMRR (typ) (dB) 90 Iout (typ) (A) 0.03 Architecture Bipolar Input common mode headroom (to negative supply) (typ) (V) 0 Input common mode headroom (to positive supply) (typ) (V) -3 Output swing headroom (to negative supply) (typ) (V) 3 Output swing headroom (to positive supply) (typ) (V) -3
PDIP (N) 14 181.42 mm² 19.3 x 9.4 SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Wide Range of Supply Voltages, Single Supply ...3 V to 36 V or Dual Supplies
  • Class AB Output Stage
  • True Differential Input Stage
  • Low Input Bias Current
  • Internal Frequency Compensation
  • Short-Circuit Protection
  • Designed to Be Interchangeable With Motorola MC3303, MC3403
  • Wide Range of Supply Voltages, Single Supply ...3 V to 36 V or Dual Supplies
  • Class AB Output Stage
  • True Differential Input Stage
  • Low Input Bias Current
  • Internal Frequency Compensation
  • Short-Circuit Protection
  • Designed to Be Interchangeable With Motorola MC3303, MC3403

The MC3303 and the MC3403 are quadruple operational amplifiers similar in performance to the uA741, but with several distinct advantages. They are designed to operate from a single supply over a range of voltages from 3 V to 36 V. Operation from split supplies also is possible, provided the difference between the two supplies is 3 V to 36 V. The common-mode input range includes the negative supply. Output range is from the negative supply to VCC – 1.5 V. Quiescent supply currents are less than one-half those of the uA741.

The MC3303 is characterized for operation from –40°C to 85°C, and the MC3403 is characterized for operation from 0°C to 70°C.

The MC3303 and the MC3403 are quadruple operational amplifiers similar in performance to the uA741, but with several distinct advantages. They are designed to operate from a single supply over a range of voltages from 3 V to 36 V. Operation from split supplies also is possible, provided the difference between the two supplies is 3 V to 36 V. The common-mode input range includes the negative supply. Output range is from the negative supply to VCC – 1.5 V. Quiescent supply currents are less than one-half those of the uA741.

The MC3303 is characterized for operation from –40°C to 85°C, and the MC3403 is characterized for operation from 0°C to 70°C.
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類型 標題 日期
* Data sheet Quadruple Low-Power Operational Amplifiers datasheet (Rev. C) 2002年 2月 11日
E-book The Signal e-book: A compendium of blog posts on op amp design topics 2017年 3月 28日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

AMP-PDK-EVM — 放大器性能開發套件評估模組

放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件，可測試通用運算放大器 (op amp) 參數，並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項，可滿足封裝需求，使工程師能夠快速評估和驗證裝置性能。

AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝，包括：

  • D (SOIC-8 和 SOIC-14)
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV (SOT23-5 和 SOT23-6)
  • DCK (SC70-5 和 SC70-6)
使用指南: PDF | HTML
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計算工具

ANALOG-ENGINEER-CALC — 類比工程師計算機

The Analog Engineer’s Calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis. This PC-based tool provides a graphical interface with a list of various common calculations ranging from setting op-amp gain with feedback (...)
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設計工具

CIRCUIT060013 — 具有 T 網路回饋電路的反相放大器

此設計可反轉輸入訊號 VIN，並使用 1000 V/V 或 60 dB 訊號增益。具有 T 回饋網路的反相放大器可在沒有較小 R4 值或超大回饋電阻器值的情況下獲得高增益。
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設計工具

CIRCUIT060015 — 可調式參考電壓電路

此電路結合反相及非反相放大器，讓參考電壓可從負輸入電壓向上調整至輸入電壓。可加入增益以提高最大負參考位準。
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設計工具

CIRCUIT060074 — 具有比較器電路的高壓側電流感測

此高壓側電流感測解決方案使用一個具有軌對軌輸入共模範圍的比較器，若負載電流上升到 1 A 以上，便在比較器輸出 (COMP OUT) 建立過電流警示 (OC 警示) 訊號。此實作中的 OC 訊號為低電位作動。因此當超過 1-A 閾值時，比較器輸出會變低。實作磁滯後會在負載電流降低至 0.5 A (減少 50%) 時，讓 OC-Alert 返回邏輯高狀態。此電路利用開漏輸出比較器，為控制數位邏輯輸入針腳而進行電平轉換輸出高邏輯電平。對於需要驅動 MOSFET 開關閘極的應用，建議使用具推挽輸出的比較器。
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
要求
模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
使用指南: PDF
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封裝 針腳 CAD 符號、佔位空間與 3D 模型
PDIP (N) 14 Ultra Librarian
SOIC (D) 14 Ultra Librarian
TSSOP (PW) 14 Ultra Librarian
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訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

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