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4.5V ~ 6.1V、28mΩ、2 ~ 5A eFuse

製品詳細

Ron (typ) (mΩ) 28 Vin (min) (V) 4.5 Vin (max) (V) 5.5 Vabsmax_cont (V) 20 Current limit (min) (A) 2.1 Current limit (max) (A) 5.2 Overcurrent response current limiting Fault response Latch-off Overvoltage response Clamp Features Analog current monitor Rating Catalog Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125 Function Adjustable current limit, Inrush current control, Overvoltage protection, Reverse current blocking, Short circuit protection, Thermal shutdown Quiescent current (Iq) (typ) (A) 0.0058 Quiescent current (Iq) (max) (A) 0.008
Ron (typ) (mΩ) 28 Vin (min) (V) 4.5 Vin (max) (V) 5.5 Vabsmax_cont (V) 20 Current limit (min) (A) 2.1 Current limit (max) (A) 5.2 Overcurrent response current limiting Fault response Latch-off Overvoltage response Clamp Features Analog current monitor Rating Catalog Device type eFuses and hot swap controllers Operating temperature range (°C) -40 to 125 Function Adjustable current limit, Inrush current control, Overvoltage protection, Reverse current blocking, Short circuit protection, Thermal shutdown Quiescent current (Iq) (typ) (A) 0.0058 Quiescent current (Iq) (max) (A) 0.008
VSON (DRC) 10 9 mm² 3 x 3
  • 5-V eFuse, VABSMAX = 20 V
  • Integrated 28-mΩ Pass MOSFET
  • Fixed 6.1-V Over Voltage Clamp
  • 2-A to 5-A Adjustable ILIMIT (±15% Accuracy)
  • Reverse Current Blocking Support
  • Programmable OUT Slew Rate, UVLO
  • Built-in Thermal Shutdown
  • UL 2367 Recognized – File No. 169910*
    • *RILIM ≤ 100 kΩ (4 A max)
  • Safe During Single Point Failure Test (UL60950)
  • Small Foot Print – 10L (3 mm × 3 mm) VSON
  • 5-V eFuse, VABSMAX = 20 V
  • Integrated 28-mΩ Pass MOSFET
  • Fixed 6.1-V Over Voltage Clamp
  • 2-A to 5-A Adjustable ILIMIT (±15% Accuracy)
  • Reverse Current Blocking Support
  • Programmable OUT Slew Rate, UVLO
  • Built-in Thermal Shutdown
  • UL 2367 Recognized – File No. 169910*
    • *RILIM ≤ 100 kΩ (4 A max)
  • Safe During Single Point Failure Test (UL60950)
  • Small Foot Print – 10L (3 mm × 3 mm) VSON

The TPS2592Bx family of eFuses is a highly integrated circuit protection and power management solution in a tiny package. The devices use few external components and provide multiple protection modes. They are a robust defense against overloads, shorts circuits, voltage surges, excessive inrush current, and reverse current.

Current limit level can be set with a single external resistor. Over voltage events are limited by internal clamping circuits to a safe fixed maximum, with no external components required. Applications with particular voltage ramp requirements can set dV/dT with a single capacitor to ensure proper output ramp rates.

Many systems, such as SSDs, must not allow holdup capacitance energy to dump back through the FET body diode onto a drooping or shorted input bus. The BFET pin is for such systems. An external NFET can be connected “Back to Back (B2B)” with the TPS2592 output and the gate driven by BFET to prevent current flow from load to source.

The TPS2592Bx family of eFuses is a highly integrated circuit protection and power management solution in a tiny package. The devices use few external components and provide multiple protection modes. They are a robust defense against overloads, shorts circuits, voltage surges, excessive inrush current, and reverse current.

Current limit level can be set with a single external resistor. Over voltage events are limited by internal clamping circuits to a safe fixed maximum, with no external components required. Applications with particular voltage ramp requirements can set dV/dT with a single capacitor to ensure proper output ramp rates.

Many systems, such as SSDs, must not allow holdup capacitance energy to dump back through the FET body diode onto a drooping or shorted input bus. The BFET pin is for such systems. An external NFET can be connected “Back to Back (B2B)” with the TPS2592 output and the gate driven by BFET to prevent current flow from load to source.

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* データシート TPS2592Bx 5-V eFuse with Over Voltage Protection and Blocking FET Control データシート PDF | HTML 2014年 12月 3日

購入と品質

記載されている情報:
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
記載されている情報:
  • ファブの拠点
  • 組み立てを実施した拠点