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SCAN921025H

활성

IEEE 1149.1 테스트 액세스를 지원하는 고온 20~80MHz 10비트 시리얼라이저

제품 상세 정보

Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
NFBGA (NZA) 49 49 mm² 7 x 7
  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

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기술 자료

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2개 모두 보기
유형 직함 날짜
* Data sheet High Temp 20-80MHz 10Bit Bus LVDS SerDes w/IEEE 1149.1 JTAG & at-speed BIST datasheet (Rev. C) 2013/05/02
Application note DS15BA101 & DS15EA101 Enable Long Reach Applications for Embedded Clock SER/DES (Rev. E) 2013/04/29

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주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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