TCAN11623-Q1
- AEC Q100 (Grade 1) Qualified for automotive applications
- Meets the requirements of ISO 11898-2:2016
- Functional Safety-Capable
- Wide input operational voltage range
- Integrated LDO for CAN transceiver supply
- 5-V LDO with 100 mA output current capability - TCAN11625
- 3.3-V LDO with 70 mA output current capability - TCAN11623
- Classic CAN and CAN FD up to 8 Mbps
- VIO level shifting supports: 1.7 V to 5.5 V
- Operating modes
- Normal mode
- Standby mode
- Low-power sleep mode
- High-voltage INH output for system power control
- Local wake-up support via the WAKE pin
- Defined behavior when unpowered
- Bus and IO terminals are high impedance (no load to operating bus or application)
- Protection features:
- ±58-V CAN bus fault tolerant
- Load dump support on VSUP
- IEC ESD protection
- Under-voltage and over-voltage protection
- Thermal shutdown protection
- TXD dominant state timeout (TXD DTO)
- Extra wide junction temperature support
- Available in the leadless VSON (14) package with wettable flank for improved automated optical inspection (AOI) capability
The TCAN1162x-Q1 are high-speed controller area network (CAN) system basis chips (SBC) that meet the physical layer requirements of the ISO 11898-2:2016 high-speed CAN specification. The TCAN1162x-Q1 supports both classical CAN and CAN FD networks up to 8 megabits per second (Mbps).
Both the TCAN11623-Q1 and TCAN11625-Q1 support a wide input supply range and integrates some form of an LDO output. The TCAN11625-Q1 has a 5-V LDO output (VCCOUT) which supplies the CAN transceiver voltage internally as well as additional current externally. The TCAN11623-Q1 has a 3.3-V LDO output (VLDO3), supplied from the 5-V LDO, supporting external loads.
The TCAN1162x-Q1 allows for system-level reductions in battery current consumption by selectively enabling the various power supplies that may be present on a system via the INH output pin. This allows an ultra-low-current sleep state where power is gated to all system components except for the TCAN1162x-Q1, while monitoring the CAN bus. When a wake-up event is detected, the TCAN1162x-Q1 initiates system start-up by driving INH high.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TCAN1162x-Q1 Automotive CAN FD System Basis Chipwith Sleep Mode and LDO Output datasheet (Rev. A) | PDF | HTML | 2021年 11月 29日 |
Technical article | 系統基礎晶片 101 - CAN、CAN FD 和 LIN SBC 入門指南 (Rev. A) | PDF | HTML | 2024年 4月 10日 | |
Application note | Protecting Automotive CAN Bus Systems From ESD Overvoltage Events | PDF | HTML | 2022年 4月 27日 | |
Functional safety information | TCAN1162x-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA | PDF | HTML | 2021年 4月 1日 | |
EVM User's guide | TCAN1162EVM User's Guide | PDF | HTML | 2019年 10月 22日 |
設計與開發
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TCAN1162EVM — 具有 WAKE 針腳與整合式 LDO 評估模組的 TCAN1162 CAN 收發器
This EVM can be used to evaluate the TLIN1162 family of devices. The CAN bus is easily accessed via test points, the J7 header, and a DSUB9 connector, standard in a lot of automotive applications for cabling. All pins are available through headers or test points. There is an integrated LDO with an (...)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
VSON (DMT) | 14 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
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