THVD9491-SEP
- Meets or exceeds the requirements of the TIA/EIA-485A and TIA/EIA-422B standards
- Total ionizing dose (TID) characterized up to 30krad (Si)
- Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30krad (Si)
- Single-event effects (SEE) characterized
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43MeV⋅cm2 /mg at 125°C
- Space enhanced plastic (Space EP)
- Controlled baseline
- One assembly and test site
- One fabrication site
- Gold bond wire
- NiPdAu lead finish
- Military temp range (-55°C to 125°C)
- Extended product life cycle
- Product traceability
- Meets the NASA ASTM E595 outgassing specification
- 3V to 5.5V supply voltage
- 1.65V to 5.5V Supply for data and enable signals
- SLR Pin Selectable Data Rates:
- 20Mbps and 50Mbps
- Bus I/O protection
- ±70V DC bus fault
- ±16kV HBM ESD
- ±8kV IEC 61000-4-2 contact discharge
- ±4kV IEC 61000-4-4 fast transient burst
- Symmetric common mode range: ±12V
- Enhanced receiver hysteresis for noise immunity
- Glitch-free power-up or down for hot plug-in capability
- Open, short, and idle bus failsafe
- 1/8 unit load (up to 256 bus nodes)
- Leaded 14-pin SOIC package
THVD9491-SEP is a space enhanced, ±70V fault-protected full-duplex RS-422/RS-485 transceiver using a 1.65V to 5.5V logic supply for data and enable logic signals, and a 3V to 5.5V bus side supply. The device has a slew rate select feature that enables the use at two maximum speeds based on the SLR pin setting.
The device features integrated IEC ESD protection, eliminating the need for external system-level protection components. The ±12V input common-mode range makes reliable data communication over longer cable run lengths and/or in the presence of large ground loop voltages. Enhanced 250mV receiver hysteresis provides high noise rejection. In addition, the receiver fail-safe feature makes sure of a logic high when the inputs are open or shorted together.
THVD9491-SEP device is available in a standard 14-pin SOIC package.
技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | THVD9491-SEP Radiation Tolerant 3V to 5.5V RS-485 Transceiver with Flexible I/O Supply and IEC ESD Protection datasheet | PDF | HTML | 2024年 1月 9日 |
設計與開發
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THVD24X2VEVM — 零件評估模組 (EVM) 的 THVD24X2V 系列
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (D) | 14 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。