ADC12J4000

ACTIVO

Convertidor analógico a digital (ADC) de muestreo de RF de 12 bits y 4,0 GSPS

Detalles del producto

Sample rate (max) (Msps) 4000 Resolution (Bits) 12 Number of input channels 1 Interface type JESD204B Analog input BW (MHz) 3200 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.725 Power consumption (typ) (mW) 2000 Architecture Folding Interpolating SNR (dB) 55 ENOB (Bits) 8.8 SFDR (dB) 71 Operating temperature range (°C) -40 to 85 Input buffer Yes
Sample rate (max) (Msps) 4000 Resolution (Bits) 12 Number of input channels 1 Interface type JESD204B Analog input BW (MHz) 3200 Features Ultra High Speed Rating Catalog Peak-to-peak input voltage range (V) 0.725 Power consumption (typ) (mW) 2000 Architecture Folding Interpolating SNR (dB) 55 ENOB (Bits) 8.8 SFDR (dB) 71 Operating temperature range (°C) -40 to 85 Input buffer Yes
VQFNP (NKE) 68 100 mm² 10 x 10
  • Excellent Noise and Linearity up to and beyond FIN = 3 GHz
  • Configurable DDC
  • Decimation Factors from 4 to 32 (Complex Baseband Out)
  • Usable Output Bandwidth of 800 MHz at
    4x Decimation and 4000 MSPS
  • Usable Output Bandwidth of 100 MHz at
    32x Decimation and 4000 MSPS
  • Bypass Mode for Full Nyquist Output Bandwidth
  • Low Pin-Count JESD204B Subclass 1 Interface
  • Automatically Optimized Output Lane Count
  • Embedded Low Latency Signal Range Indication
  • Low Power Consumption
  • Key Specifications:
    • Max Sampling Rate: 4000 MSPS
    • Min Sampling Rate: 1000 MSPS
    • DDC Output Word Size: 15-Bit Complex (30 bits total)
    • Bypass Output Word Size: 12-Bit Offset Binary
    • Noise Floor: −149 dBFS/Hz or −150.8 dBm/Hz
    • IMD3: −64 dBc (FIN = 2140 MHz ± 30 MHz at −13 dBFS)
    • FPBW (–3 dB): 3.2 GHz
    • Peak NPR: 46 dB
    • Supply Voltages: 1.9 V and 1.2 V
    • Power Consumption
      • Bypass (4000 MSPS): 2 W
      • Decimate by 10 (4000 MSPS): 2 W
      • Power Down Mode: <50 mW
  • Excellent Noise and Linearity up to and beyond FIN = 3 GHz
  • Configurable DDC
  • Decimation Factors from 4 to 32 (Complex Baseband Out)
  • Usable Output Bandwidth of 800 MHz at
    4x Decimation and 4000 MSPS
  • Usable Output Bandwidth of 100 MHz at
    32x Decimation and 4000 MSPS
  • Bypass Mode for Full Nyquist Output Bandwidth
  • Low Pin-Count JESD204B Subclass 1 Interface
  • Automatically Optimized Output Lane Count
  • Embedded Low Latency Signal Range Indication
  • Low Power Consumption
  • Key Specifications:
    • Max Sampling Rate: 4000 MSPS
    • Min Sampling Rate: 1000 MSPS
    • DDC Output Word Size: 15-Bit Complex (30 bits total)
    • Bypass Output Word Size: 12-Bit Offset Binary
    • Noise Floor: −149 dBFS/Hz or −150.8 dBm/Hz
    • IMD3: −64 dBc (FIN = 2140 MHz ± 30 MHz at −13 dBFS)
    • FPBW (–3 dB): 3.2 GHz
    • Peak NPR: 46 dB
    • Supply Voltages: 1.9 V and 1.2 V
    • Power Consumption
      • Bypass (4000 MSPS): 2 W
      • Decimate by 10 (4000 MSPS): 2 W
      • Power Down Mode: <50 mW

The ADC12J4000 device is a wideband sampling and digital tuning device. Texas Instruments’ giga-sample analog-to-digital converter (ADC) technology enables a large block of frequency spectrum to be sampled directly at RF. An integrated DDC (Digital Down Converter) provides digital filtering and down-conversion. The selected frequency block is made available on a JESD204B serial interface. Data is output as baseband 15-bit complex information for ease of downstream processing. Based on the digital down-converter (DDC) decimation and link output rate settings, this data is output on 1 to 5 lanes of the serial interface.

A DDC bypass mode allows the full rate 12-bit raw ADC data to also be output. This mode of operation requires 8 lanes of serial output.

The ADC12J4000 device is available in a 68-pin VQFN package. The device operates over the Industrial (–40°C ≤ TA ≤ 85°C) ambient temperature range.

The ADC12J4000 device is a wideband sampling and digital tuning device. Texas Instruments’ giga-sample analog-to-digital converter (ADC) technology enables a large block of frequency spectrum to be sampled directly at RF. An integrated DDC (Digital Down Converter) provides digital filtering and down-conversion. The selected frequency block is made available on a JESD204B serial interface. Data is output as baseband 15-bit complex information for ease of downstream processing. Based on the digital down-converter (DDC) decimation and link output rate settings, this data is output on 1 to 5 lanes of the serial interface.

A DDC bypass mode allows the full rate 12-bit raw ADC data to also be output. This mode of operation requires 8 lanes of serial output.

The ADC12J4000 device is available in a 68-pin VQFN package. The device operates over the Industrial (–40°C ≤ TA ≤ 85°C) ambient temperature range.

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Documentación técnica

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Documentación principal Tipo Título Opciones de formato Fecha
* Data sheet ADC12J4000 12-Bit, 4-GSPS ADC With Integrated DDC datasheet (Rev. D) PDF | HTML 19 oct 2017
Technical article How to minimize filter loss when you drive an ADC PDF | HTML 20 oct 2016
Application note 66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B) 20 jun 2016
Technical article How to complete your RF sampling solution PDF | HTML 18 may 2016
Technical article RF sampling: clocking is the key every time PDF | HTML 11 dic 2015
Technical article Are 66AK2L06 SoCs an answer to miniaturization of test and measurement equipment? PDF | HTML 02 dic 2015
Technical article RF sampling: interleaving builds faster ADCs PDF | HTML 29 oct 2015
Design guide 66AK2L06 JESD Attach to ADC12J4000 / DAC38J84 Design Guide (Rev. A) 22 oct 2015
Application note System solution for avionics & defense 23 sep 2015
Technical article RF sampling: digital mixers make mixing fun PDF | HTML 17 sep 2015
Technical article RF sampling: How over-sampling is cheating physics PDF | HTML 21 ago 2015
Technical article Managing input data rates is a breeze PDF | HTML 19 jun 2015
Technical article Why bother with RF sampling? PDF | HTML 15 may 2015
Analog Design Journal Analog Applications Journal 2Q 2015 28 abr 2015
Analog Design Journal JESD204B multi-device synchronization: Breaking down the requirements 28 abr 2015
White paper Ready to make the jump to JESD204B? White Paper (Rev. B) 19 mar 2015

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

ADC12J4000EVM — Módulo de evaluación del convertidor analógico a digital de muestreo de RF ADC12J4000 de 12 bits, 4,

The ADC12J4000EVM is an evaluation module (EVM) that allows for the evaluation of TI's ADC12J4000. The ADC12J4000 is a low power, 12-bit, 4-GSPS RF-sampling analog to digital converter (ADC) with a buffered analog input, integrated Digital Down Converter with programmable NCO and decimation (...)

Guía del usuario: PDF
Firmware

TI204C-IP Request for JESD204 rapid design IP

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Modelo de simulación

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Modelo de simulación

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Herramienta de cálculo

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Diseños de referencia

TIDA-00431 — Diseño de referencia ADC de 4 GSPS de muestreo RF con amplificador diferencial de acoplamiento de CC

Wideband radio frequency (RF) receivers allow greatly increased flexibility in radio designs. The wide instantaneous bandwidth allows flexible tuning without changing hardware and the ability to capture multiple channels at widely separated frequencies.

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TIDA-01015 — Diseño de referencia de reloj de 4 GHz para ADC de alta velocidad de 12 bits en osciloscopios digita

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TIDA-00826 — Diseño de referencia de extremo frontal del osciloscopio de 2 GHz de 50 ohmios

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Diseños de referencia

TIDA-00467 — Diseño de referencia de sincronización de varios ADC JESD204B para la ubicación de posición del emis

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TIDA-00432 — Sincronización de ADC de JESD204B Giga-Sample mediante la plataforma Xilinx para sistemas de radar d

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TIDA-00359 — Diseño de referencia de la solución de registro de tiempo para ADC de GSPS

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VQFNP (NKE) 68 Ultra Librarian

Pedidos y calidad

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  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
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  • Lugar de fabricación
  • Lugar de ensamblaje

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