SN54LS164-SP

ACTIVO

Registros de desplazamiento en serie de salida paralela de 8 bits

Detalles del producto

Configuration Serial-in, Parallel-out Bits (#) 8 Technology family LS Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Input type Bipolar Output type Push-Pull Clock frequency (MHz) 25 IOL (max) (mA) 8 IOH (max) (mA) -0.4 Supply current (max) (µA) 27000 Features High speed (tpd 10-50ns) Operating temperature range (°C) -55 to 125 Rating Space
Configuration Serial-in, Parallel-out Bits (#) 8 Technology family LS Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Input type Bipolar Output type Push-Pull Clock frequency (MHz) 25 IOL (max) (mA) 8 IOH (max) (mA) -0.4 Supply current (max) (µA) 27000 Features High speed (tpd 10-50ns) Operating temperature range (°C) -55 to 125 Rating Space
CDIP (J) 14 130.4652 mm² 19.56 x 6.67 CFP (W) 14 58.023 mm² 9.21 x 6.3
  • Gated Serial Inputs
  • Fully Buffered Clock and Serial Inputs
  • Asynchronous Clear

 

  • Gated Serial Inputs
  • Fully Buffered Clock and Serial Inputs
  • Asynchronous Clear

 

These 8-bit shift registers feature gated serial inputs and an asynchronous clear. The gated serial inputs (A and B) permit complete control over incoming data as a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock pulse. A high-level input enables the other input which will then determine the state of the first flip-flop. Data at the serial inputs may be changed while the clock is high or low, but only information meeting the setup-time requirements will be entered. Clocking occurs on the low-to-high-level transition of the clock input. All inputs are diode-clamped to minimize transmission-line effects.

The SN54164 and SN54LS164 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74164 and SN74LS164 are characterized for operation from 0°C to 70°C.

 

These 8-bit shift registers feature gated serial inputs and an asynchronous clear. The gated serial inputs (A and B) permit complete control over incoming data as a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock pulse. A high-level input enables the other input which will then determine the state of the first flip-flop. Data at the serial inputs may be changed while the clock is high or low, but only information meeting the setup-time requirements will be entered. Clocking occurs on the low-to-high-level transition of the clock input. All inputs are diode-clamped to minimize transmission-line effects.

The SN54164 and SN54LS164 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74164 and SN74LS164 are characterized for operation from 0°C to 70°C.

 

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Documentación técnica

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Tipo Título Fecha
* Data sheet 8-Bit Parallel-Out Serial Shift Registers datasheet 01 mar 1988
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Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 dic 2022
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Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 ago 2002
Application note Designing With Logic (Rev. C) 01 jun 1997
Application note Designing with the SN54/74LS123 (Rev. A) 01 mar 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 oct 1996
Application note Live Insertion 01 oct 1996

Diseño y desarrollo

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Encapsulado Pines Símbolos CAD, huellas y modelos 3D
CDIP (J) 14 Ultra Librarian
CFP (W) 14 Ultra Librarian

Pedidos y calidad

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  • REACH
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  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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