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TPS7H3014-SP

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抗輻射 QMLV、14V 四通道電源供應序列器

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產品規格表

TPS7H3014-SP

現行
產品規格表 立即訂購

產品詳細資料

Supply voltage (min) (V) 3 Number of supplies monitored 4 Supply voltage (max) (V) 14 Iq (typ) (mA) 2.5 Number of sequenced outputs 4 Rating Space Operating temperature range (°C) -55 to 125
Supply voltage (min) (V) 3 Number of supplies monitored 4 Supply voltage (max) (V) 14 Iq (typ) (mA) 2.5 Number of sequenced outputs 4 Rating Space Operating temperature range (°C) -55 to 125
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si)
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75MeV-cm2/mg
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Available in military (–55°C to 125°C) temperature range
  • Radiation performance:
    • Radiation hardness assurance (RHA) up to a total ionizing dose (TID) of 100krad(Si)
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune up to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized up to LET = 75MeV-cm2/mg
  • Wide supply IN voltage range (VIN): 3V to 14V
  • Sequence and monitor up to 4 voltage rails with a single device
    • Daisy chain capability for extended channel count
  • Single resistor programmable global timers for:
    • Sequence up and down delay
    • Sequence up time to regulation
  • Reverse order sequence down
  • Precision threshold voltage and hysteresis current
    • VTH_SENSEx of 599mV ±1% across: voltage, temperature, and radiation (TID)
    • IHYS_SENSEx of 24µA ±3% across: voltage, temperature, and radiation (TID)
  • Push-pull outputs with programmable pull-up voltage between 1.6V to 7V
    • Global ENx pull-up domain (VPULL_UP1)
    • Common SEQ_DONE and PWRGD pull-up domain (VPULL_UP2)
  • FAULT open drain output for monitoring of state machine induced faults
  • Available in military (–55°C to 125°C) temperature range

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.

The TPS7H3014 is an integrated, 3V to 14V, four-channel radiation-hardness-assured power-supply sequencer. Channel count can be expanded by connecting multiple devices in a daisy-chain configuration. The device provides sequence up and down control signals for integrated circuits (IC) with active high ("on") inputs. In addition SEQ_DONE and PWRGD flags are provided to monitor the sequence and power status of the monitored power tree.

An accurate 599mV ±1% threshold voltage and a 24µA ±3% hysteresis current provide programmable rise and fall monitoring voltages. The rise and fall delay time is globally programmed via a single resistor. Also, a time-to-regulation timer is provided to track the rising voltage on SENSEx. In addition to these features, a FAULT detection pin is incorporated to monitor internally generated faults and provide increased system level reliability for power sequencing space applications. A standard microcircuit drawing (SMD) is available for the QML variant, 5962R2320101VXC.
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類型 標題 日期
* Data sheet TPS7H3014-SP Radiation-Hardened, 14V, 4-Channel Sequencer datasheet (Rev. B) PDF | HTML 2024年 6月 12日
* SMD TPS7H3014-SP SMD 5962-23201 2024年 6月 20日
* Radiation & reliability report TPS7H3014-SP Single-Event Effects (SEE) PDF | HTML 2024年 6月 12日
* Radiation & reliability report TPS7H3014-SP Neutron Displacement Damage (NDD) Characterization Report 2024年 4月 4日
* Radiation & reliability report TPS7H3014-SP Total Ionizing Dose (TID) Report 2024年 4月 4日
Application brief DLA Approved Optimizations for QML Products (Rev. B) PDF | HTML 2024年 10月 23日
Selection guide TI Space Products (Rev. J) 2024年 2月 12日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 2023年 8月 31日
Application note QML flow, its importance, and obtaining lot information (Rev. C) 2023年 8月 30日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 2022年 11月 17日
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 2020年 8月 21日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日

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TPS7H3014EVM-CVAL — TPS7H3014-SP 評估模組

TPS7H3014EVM-CVAL 展示了單一 TPS7H3014-SP 序列器的操作。電路板提供可裝入其他元件的元件封裝，以便進行自訂配置測試，例如菊輪鍊序列器。
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