UCC27524A1-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- Device temperature grade 1: –40°C to +125°C ambient operating temperature range
- Industry-standard pin out
- Two independent gate-drive channels
- 5A peak source and sink-drive current
- Independent enable function for each output
- TTL and CMOS-compatible logic threshold independent of supply voltage
- Hysteretic-logic thresholds for high-noise immunity
- Ability to handle negative voltages (–5V) at inputs
- Inputs and enable pin voltage levels not restricted by VDD pin bias supply voltage
- 4.5V to 18V single supply range
- Outputs held low during VDD-UVLO, (ensures glitch-free operation at power up and power down)
- Fast propagation delays (17ns typical)
- Fast rise and fall times (3.5ns and 6ns typical)
- 1ns typical delay matching between two channels
- Ability to parallel two outputs for high-drive current
- Outputs held low when inputs are floating
- MSOP-8 PowerPad™ package
- Operating junction temperature range of –40°C to 150°C
The UCC27524A1-Q1 device is a dual-channel, high-speed, low-side, gate-driver device capable of effectively driving MOSFET and IGBT power switches. The UCC27524A1-Q1 device is a variant of the UCC2752x family. The UCC27524A1-Q1 device adds the ability to handle –5V directly at the input pins for increased robustness. The UCC27524A1-Q1 device is a dual, non-inverting driver. Using a design that inherently minimizes shoot-through current, the UCC27524A1-Q1 device is capable of delivering high-peak current pulses of up to 5A source and 5A sink into capacitive loads along with rail-to-rail drive capability and extremely small propagation delay (typically 17ns). In addition, the drivers feature matched, internal-propagation delays between the two channels which are very well suited for applications requiring dual-gate drives with critical timing, such as synchronous rectifiers. This also enables connecting two channels in parallel to effectively increase current-drive capability or driving two switches in parallel with a single input signal. The input pin thresholds are based on TTL and CMOS compatible low-voltage logic, which is fixed and independent of the VDD supply voltage. Wide hysteresis between the high and low thresholds offers excellent noise immunity.
For protection purposes, internal pull-up and pull-down resistors on the input pins of the UCC27524A1-Q1 device ensure that outputs are held LOW when input pins are in floating condition. The UCC27524A1-Q1 device features enable pins (ENA and ENB) to have better control of the operation of the driver applications. The pins are internally pulled up to VDD for active-high logic and are left open for standard operation.
The UCC27524A1-Q1 devices is available in a MSOP-PowerPAD-8 with exposed pad (DGN) package.
기술 자료
유형 | 직함 | 날짜 | ||
---|---|---|---|---|
* | Data sheet | UCC27524A1-Q1 Dual 5A, High-Speed, Low-Side Gate Driver With Negative Input Voltage Capability datasheet (Rev. A) | PDF | HTML | 2024/06/13 |
Application note | Why use a Gate Drive Transformer? | PDF | HTML | 2024/03/04 | |
Application brief | External Gate Resistor Selection Guide (Rev. A) | 2020/02/28 | ||
Application brief | Understanding Peak IOH and IOL Currents (Rev. A) | 2020/02/28 | ||
Application brief | High-Side Cutoff Switches for High-Power Automotive Applications (Rev. A) | 2018/11/26 | ||
More literature | Fundamentals of MOSFET and IGBT Gate Driver Circuits (Replaces SLUP169) (Rev. A) | 2018/10/29 | ||
Application note | PFC Design Choice for On Board Charger Designs | 2018/05/24 | ||
Application brief | Reducing Switching Losses in On-Board Chargers for Electric Vehicles | 2018/03/27 |
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
PSPICE-FOR-TI — TI 설계 및 시뮬레이션 툴용 PSpice®
TI 설계 및 시뮬레이션 환경용 PSpice는 기본 제공 라이브러리를 이용해 복잡한 혼합 신호 설계를 시뮬레이션할 수 있습니다. 레이아웃 및 제작에 (...)
패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
---|---|---|
HVSSOP (DGN) | 8 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치
권장 제품에는 본 TI 제품과 관련된 매개 변수, 평가 모듈 또는 레퍼런스 디자인이 있을 수 있습니다.