SN55LVDS31-SP
- QML-V Qualified, SMD 5962-97621
- Meet or Exceed the Requirements of ANSI TIA/EIA-644 Standard
- Low-Voltage Differential Signaling With Typical Output Voltage
of 350 mV and 100-Ω Load - Typical Output Voltage Rise and Fall Times of 500 ps (400 Mbps)
- Typical Propagation Delay Times of 1.7 ns
- Operate From a Single 3.3-V Supply
- Power Dissipation 25 mW Typical Per Driver at 200 MHz
- Driver at High Impedance When Disabled or With VCC = 0
- Bus-Terminal ESD Protection Exceeds 8 kV
- Low-Voltage TTL (LVTTL) Logic Input Levels
- Cold Sparing for Space and High Reliability Applications Requiring Redundancy
The SN55LVDS31 is a differential line driver that implements the electrical characteristics of low-voltage differential signaling (LVDS). This signaling technique lowers the output voltage levels of 5-V differential standard levels (such as TIA/EIA-422B) to reduce the power, increase the switching speeds, and allow operation with a 3.3-V supply rail. This driver will deliver a minimum differential output voltage magnitude of 247 mV into a 100-Ω load when enabled.
The intended application of this device and signaling technique is both point-to-point and multidrop (one driver and multiple receivers) data transmission over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.
The SN55LVDS31 is characterized for operation from –55°C to 125°C.
技術文件
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | High-Speed Differential Line Driver - SN55LVDS31-SP datasheet | 2012年 3月 1日 | |
| * | SMD | SN55LVDS31-SP SMD 5962-97621 | 2016年 7月 8日 | |
| * | Radiation & reliability report | SN55LVDS31 and SN55LVDS32 SEE Report | 2015年 3月 31日 | |
| * | Radiation & reliability report | SN55LVDS31J Radiation Test Report | 2015年 3月 31日 | |
| Application brief | DLA Approved Optimizations for QML Products (Rev. B) | PDF | HTML | 2024年 10月 23日 | |
| Selection guide | TI Space Products (Rev. J) | 2024年 2月 12日 | ||
| More literature | TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) | 2023年 8月 31日 | ||
| Application note | Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) | PDF | HTML | 2022年 11月 17日 | |
| Application note | Single-Event Effects Confidence Interval Calculations (Rev. A) | PDF | HTML | 2022年 10月 19日 | |
| Application brief | Space-Grade, 100-krad, Isolated Serial Peripheral Interface (SPI) LVDS Circuit | PDF | HTML | 2021年 6月 29日 | |
| E-book | Radiation Handbook for Electronics (Rev. A) | 2019年 5月 21日 |
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