Gehäuseinformationen
| Gehäuse | Pins SOT-23 (DBV) | 5 |
| Betriebstemperaturbereich (°C) -40 to 125 |
| Gehäusemenge | Träger 3.000 | LARGE T&R |
Merkmale von SN74LV1T00-Q1
- AEC-Q100
qualified for automotive applications:
-
Device temperature grade 1: -40°C to +125°C
-
Device HBM ESD classification level 2
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Device CDM ESD classification level C4B
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- Wide operating range of 1.8V to 5.5V
- Single-supply voltage translator (refer to
LVxT Enhanced Input Voltage):
-
Up translation:
- 1.2V to 1.8V
- 1.5V to 2.5V
- 1.8V to 3.3V
- 3.3V to 5.0V
-
Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
-
- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 250mAper JESD 17
Beschreibung von SN74LV1T00-Q1
The SN74LV1T00-Q1 is a 2-input NAND Gate. Each gate performs the Boolean function Y = A × B in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.8V, 2.5V, 3.3V, and 5V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3V to 2.5V output).