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CD4002B

ACTIVO

Puertas NOR de 2 canales, 4 entradas, 3 V a 18 V

Detalles del producto

Technology family CD4000 Number of channels 2 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Inputs per channel 4 IOL (max) (mA) 6.8 IOH (max) (mA) -6.8 Output type Push-Pull Input type Standard CMOS Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Catalog Operating temperature range (°C) -55 to 125
Technology family CD4000 Number of channels 2 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Inputs per channel 4 IOL (max) (mA) 6.8 IOH (max) (mA) -6.8 Output type Push-Pull Input type Standard CMOS Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Catalog Operating temperature range (°C) -55 to 125
PDIP (N) 14 181.42 mm² 19.3 x 9.4 SOIC (D) 14 51.9 mm² 8.65 x 6 SOP (NS) 14 79.56 mm² 10.2 x 7.8 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Buffered inputs and outputs
  • Standardized symmetrical output characteristics
  • 100% tested for maximum quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (over full package temperature range):
         1 V at VDD = 5 V
         2 V at VDD = 10 V
      2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"

Data sheet acquired from Harris Semiconductor

  • Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Buffered inputs and outputs
  • Standardized symmetrical output characteristics
  • 100% tested for maximum quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (over full package temperature range):
         1 V at VDD = 5 V
         2 V at VDD = 10 V
      2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"

Data sheet acquired from Harris Semiconductor

CD4001B, CD4002B, and CD4025B NOR gates provide the system designer with direct implementation of the NOR function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

The CD4001B, CD4002B, and CD4025B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4001B, CD4002B, and CD4025B NOR gates provide the system designer with direct implementation of the NOR function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

The CD4001B, CD4002B, and CD4025B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

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SN74LVC2G02 ACTIVO Puertas NOR de 2 canales, 2 entradas, 1.65 V a 5.5 V Smaller voltage range (1.65V to 5.5V), shorter average propagation delay (5.5ns), higher average drive strength (24mA)

Documentación técnica

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Tipo Título Fecha
* Data sheet CD4001B, CD4002B, CD4025B Types datasheet (Rev. C) 21 ago 2003

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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