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LF298-MIL

ACTIVO

Circuito de muestra y retención monolítico

Detalles del producto

Rating Military Operating temperature range (°C) 0 to 0
Rating Military Operating temperature range (°C) 0 to 0
TO-CAN (LMC) 8 80.2816 mm² 8.96 x 8.96
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510
  • Operates from ±5-V to ±18-V Supplies
  • Less than 10-µs Acquisition Time
  • Logic Input Compatible With TTL, PMOS, CMOS
  • 0.5-mV Typical Hold Step at Ch = 0.01 µF
  • Low Input Offset
  • 0.002% Gain Accuracy
  • Low Output Noise in Hold Mode
  • Input Characteristics Do Not Change During Hold Mode
  • High Supply Rejection Ratio in Sample or Hold
  • Wide Bandwidth
  • Space Qualified, JM38510

The LF298-MIL devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LF298-MIL to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LF298-MIL are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LF298-MIL will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

The LF298-MIL devices are monolithic sample-and-hold circuits that use BI-FET technology to obtain ultrahigh DC accuracy with fast acquisition of signal and low droop rate. Operating as a unity-gain follower, DC gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin and does not degrade input offset drift. The wide bandwidth allows the LF298-MIL to be included inside the feedback loop of 1-MHz operational amplifiers without having stability problems. Input impedance of 1010 Ω allows high-source impedances to be used without degrading accuracy.

P-channel junction FETs are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1-µF hold capacitor. The JFETs have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design ensures no feedthrough from input to output in the hold mode, even for input signals equal to the supply voltages.

Logic inputs on the LF298-MIL are fully differential with low input current, allowing for direct connection to TTL, PMOS, and CMOS. Differential threshold is
1.4 V. The LF298-MIL will operate from ±5-V to ±18-V supplies.

An A version is available with tightened electrical specifications.

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* Data sheet LF298-MIL Monolithic Sample-and-Hold Circuits datasheet PDF | HTML 21 jun 2017

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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