Inicio Gestión de la energía Reguladores lineales y de baja salida (LDO)
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Gestión de la energía
Reguladores lineales y de baja salida (LDO)

TPS7H1210-SEP

ACTIVO

Regulador lineal negativo de 1 A, entrada de -3 V a -16.5 V, resistente a la radiación en plástico m

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TPS7H1210-SEP

ACTIVO
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Detalles del producto

Output options Adjustable Output, Negative Output Iout (max) (A) 1 Vin (max) (V) -3 Vin (min) (V) -16.5 Vout (max) (V) -1.2 Vout (min) (V) -15.5 Noise (µVrms) 13.7 Iq (typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft start Accuracy (%) 2 PSRR at 100 KHz (dB) 61 Dropout voltage (Vdo) (typ) (mV) 363 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 43 Radiation, TID (typ) (krad) 30
Output options Adjustable Output, Negative Output Iout (max) (A) 1 Vin (max) (V) -3 Vin (min) (V) -16.5 Vout (max) (V) -1.2 Vout (min) (V) -15.5 Noise (µVrms) 13.7 Iq (typ) (mA) 0.21 Thermal resistance θJA (°C/W) 32.7 Rating Space Load capacitance (min) (µF) 10 Regulated outputs (#) 1 Features Enable, Soft start Accuracy (%) 2 PSRR at 100 KHz (dB) 61 Dropout voltage (Vdo) (typ) (mV) 363 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 43 Radiation, TID (typ) (krad) 30
VQFN (RGW) 20 25 mm² 5 x 5
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing
  • Vendor item drawing available, VID V62/21616
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • TID RLAT (radiation lot acceptance testing) for every wafer lot to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latchup (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 43 MeV-cm2/mg
    • Single-event functional interrupt (SEFI) and single-event transient (SET) characterized to LET = 43 MeV-cm2/mg
  • Low noise: 13.7-µVRMS typical (10 Hz to 100 kHz)
  • High power-supply rejection ration, PSRR (typical at VIN = –6 V, VOUT = –5 V, IOUT = 1 A):
    • 61 dB at 100 Hz
    • 61 dB at 100 kHz
    • 41 dB at 1 MHz
  • Input voltage range: –3 V to –16.5 V
  • Adjustable output: –1.2 V to –15.5 V
  • Up to 1-A output current
  • Stable with ceramic capacitors ≥ 10 µF
  • Built-in current-limit and thermal shutdown protection
  • Space Enhanced Plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Extended product-change notification (PCN)
    • Product traceability
    • Enhanced mold compound for low outgassing

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.

The TPS7H1210-SEP negative voltage linear regulator is a low noise, high PSRR regulator capable of sourcing a maximum load of 1 A.

The regulator include a CMOS logic-level-compatible enable pin (EN) to allow for user-customizable power management schemes. Other features include built-in current limit and thermal shutdown to protect the device and system during fault conditions.

The TPS7H1210-SEP device is designed using bipolar technology primarily for high-accuracy, low-noise applications, where clean voltage rails are critical to maximize system performance. Therefore, it ideal to power op amps, ADCs, DACs, and other high-performance analog circuitry.

Additionally, the TPS7H1210-SEP device is suitable for post DC-DC converter regulation. By filtering the output voltage ripple inherent to DC-DC switching conversion, maximum system performance is ensured in sensitive devices and RF applications.
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Documentación técnica

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Tipo Título Fecha
* Data sheet TPS7H1210-SEP –16.5-V, 1-A, Negative Linear Regulator in Space Enhanced Plastic datasheet PDF | HTML 23 nov 2021
* VID TPS7H1210-SEP VID V62-21616 04 ene 2022
* Radiation & reliability report TPS7H1210-SEP Single-Event Effects (SEE) Test Report 13 dic 2021
* Radiation & reliability report TPS7H1210-SEP Neutron Displacement Damage (NDD) Characterization 24 nov 2021
* Radiation & reliability report TPS7H1210-SEP Total Ionizing Dose (TID) 24 nov 2021
* Radiation & reliability report TPS7H1210-SEP Production Flow and Reliability Report PDF | HTML 08 nov 2021
Selection guide TI Space Products (Rev. J) 12 feb 2024
Technical article How Space Enhanced Products Address Challenges in low Earth orbit Applications (Rev. A) PDF | HTML 18 dic 2023
White paper Parallel LDO Architecture Design Using Ballast Resistors PDF | HTML 14 dic 2022
White paper Comprehensive Analysis and Universal Equations for Parallel LDO's Using Ballast PDF | HTML 13 dic 2022
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 15 sep 2022
User guide TPS7H1210EVM User's Guide PDF | HTML 22 nov 2021
Certificate TPS7H1210EVM EU RoHS Declaration of Conformity (DoC) 04 oct 2021
E-book Radiation Handbook for Electronics (Rev. A) 21 may 2019

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

TPS7H1210EVM — Módulo de evaluación TPS7H1210-SEP para regulador lineal negativo de 1 A y con entrada de -3 V a -16

El módulo de evaluación (EVM) TPS7H1210 es una placa de demostración de ingeniería para evaluar el regulador lineal de tensión negativa con espacio mejorado y caída baja (LDO) TPS7H1210‑SEP.

Guía del usuario: PDF | HTML
No disponible en TI.com
Modelo de simulación

TPS7H1210-SEP PSpice Transient Model

SBVM985.ZIP (23 KB) - PSpice Model
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Diseños de referencia

TIDA-010274 — Space-grade discrete RF sampling transceiver reference design

This reference design incorporates a 10 GSPS dual digital-to-analog converter and a 5 GSPS dual analog-to-digital converter with active baluns on the RF interface supporting up through X-band. The design also incorporates a space-grade clocking daughter card and a space-grade power solution (...)
Design guide: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
VQFN (RGW) 20 Ultra Librarian
Se aplican los Términos y condiciones estándar de TI para los elementos de evaluación.

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Los productos recomendados pueden tener parámetros, módulos de evaluación o diseños de referencia relacionados con este producto de TI.

Soporte y capacitación

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