驅動程式或資料庫
UCC21520-Q1-DESIGN — UCC21520-Q1 design resources
FuSa supporting document
現在提供此產品的更新版本
引腳對引腳且具備與所比較裝置相同的功能
UCC21530-Q1
- AEC-Q100 qualified with:
- Device temperature grade 1
- Functional Safety Quality-Managed
- Universal: dual low-side, dual high-side or half-bridge driver
- Wide body SOIC-14 (DWK) package
- 3.3mm spacing between driver channels
- Switching parameters:
- 33ns typical propagation delay
- 20ns minimum pulse width
- 6ns maximum pulse-width distortion
- Common-mode transient immunity (CMTI) greater than 125V/ns
- 4A peak source, 6A peak sink output
- TTL and CMOS compatible inputs
- 3V to 18V input VCCI range
- Up to 25V VDD output drive supply
- 8V,12V and 17V VDD UVLO options
- Programmable overlap and dead time
- Junction temperature range –40 to +150°C
The UCC21530-Q1 is an isolated dual-channel gate driver with 4A source and 6A sink peak current. It is designed to drive IGBTs, Si MOSFETs, and SiC MOSFETs up to 5MHz.
The input side is isolated from the two output drivers by a 5.7kVRMS reinforced isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI). Internal functional isolation between the two secondary-side drivers allows a working voltage of up to 1850V.
This device can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver with programmable dead time (DT). The EN pin pulled low shuts down both outputs simultaneously and allows for normal operation when left open or pulled high. As a fail-safe measure, primary-side logic failures force both outputs low.
The device accepts VDD supply voltages up to 25V. A wide input VCCI range from 3V to 18V makes the driver suitable for interfacing with both analog and digital controllers. All the supply voltage pins have under voltage lock-out (UVLO) protection.
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檢視所有 10 | 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | UCC21530-Q1 4A, 6A, 5.7kVRMS Isolated Dual-Channel Gate Driver with 3.3mm Channel-to-Channel Spacing datasheet (Rev. F) | PDF | HTML | 2024年 9月 17日 |
| White paper | 以可靠且經濟實惠的隔離技術解決高電壓設計挑戰 (Rev. C) | PDF | HTML | 2024年 3月 7日 | |
| Certificate | VDE Certificate for Reinforced Isolation for DIN EN IEC 60747-17 (Rev. S) | 2024年 2月 29日 | ||
| Application note | Impact of Narrow Pulse Widths in Gate Driver Circuits (Rev. A) | PDF | HTML | 2024年 1月 25日 | |
| Certificate | UCC21540 CQC Certificate of Product Certification | 2023年 8月 17日 | ||
| Certificate | UCC215xx CQC Certificate of Product Certification | 2023年 8月 17日 | ||
| Certificate | UL Certification E181974 Vol 4. Sec 7 (Rev. C) | 2022年 12月 2日 | ||
| Application brief | The Use and Benefits of Ferrite Beads in Gate Drive Circuits | PDF | HTML | 2021年 12月 16日 | |
| Certificate | CSA Product Certificate (Rev. A) | 2019年 8月 15日 | ||
| Technical article | Searching for the newest innovations in power? Find them at APEC | PDF | HTML | 2019年 2月 9日 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
開發板
UCC21530EVM-286 — UCC21530 隔離式雙通道驅動器評估模組
UCC21530EVM-286 is designed for evaluating UCC21530DWK, which is an isolated dual-channel gate driver with 4-A source and 6-A sink peak current, 12V UVLO, Enable (Active High) Function and 3.3 mm creepage between channels . This EVM could be served as a reference design for driving IGBTS and SiC (...)
驅動程式或資料庫
UCC21530-Q1-DESIGN — UCC21530-Q1 design resources
FS documents
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| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (DWK) | 14 | Ultra Librarian |
訂購與品質
內含資訊：
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
內含資訊：
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。