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SN75C1154

ACTIVO

Receptores/controladores de baja potencia cuádruples

Detalles del producto

Drivers per package 4 Receivers per package 4 Logic voltage (min) (V) 5 Data rate (max) (Mbps) 0.095 Main supply voltage (nom) (V) 5 ESD HBM (kV) 0 Rating Catalog Operating temperature range (°C) 0 to 70 Vout (typ) (V) 10.7
Drivers per package 4 Receivers per package 4 Logic voltage (min) (V) 5 Data rate (max) (Mbps) 0.095 Main supply voltage (nom) (V) 5 ESD HBM (kV) 0 Rating Catalog Operating temperature range (°C) 0 to 70 Vout (typ) (V) 10.7
PDIP (N) 20 228.702 mm² 24.33 x 9.4 SOIC (DW) 20 131.84 mm² 12.8 x 10.3
  • Meet or Exceed the Requirements of TIA/EIA-232-F and ITU Recommendation V.28
  • Very Low Power Consumption . . .5 mW Typ
  • Wide Driver Supply Voltage . . .±4.5 V to ±15 V
  • Driver Output Slew Rate Limited to 30 V/µs Max
  • Receiver Input Hysteresis . . . 1000 mV Typ
  • Push-Pull Receiver Outputs
  • On-Chip Receiver 1-µs Noise Filter

  • Meet or Exceed the Requirements of TIA/EIA-232-F and ITU Recommendation V.28
  • Very Low Power Consumption . . .5 mW Typ
  • Wide Driver Supply Voltage . . .±4.5 V to ±15 V
  • Driver Output Slew Rate Limited to 30 V/µs Max
  • Receiver Input Hysteresis . . . 1000 mV Typ
  • Push-Pull Receiver Outputs
  • On-Chip Receiver 1-µs Noise Filter

The SN65C1164 and SN75C1154 are low-power BiMOS devices containing four independent drivers and receivers that are used to interface data terminal equipment (DTE) with data circuit-terminating equipment (DCE). These devices are designed to conform to TIA/EIA-232-F. The drivers and receivers of the SN65C1154 and SN75C1154 are similar to those of the SN75C188 quadruple driver and SN75C189A quadruple receiver, respectively. The drivers have a controlled output slew rate that is limited to a maximum of 30 V/µs and the receivers have filters that reject input noise pulses of shorter than 1 µs. Both these features eliminate the need for external components.

The SN65C1154 and SN75C1154 have been designed using low-power techniques in a BiMOS technology. In most applications, the receivers contained in these devices interface to single inputs of peripheral devices such as ACEs, UARTs, or microprocessors. By using sampling, such peripheral devices usually are insensitive to the transition times of the input signals. If this is not the case, or for other uses, it is recommended that the SN65C1154 and SN75C1154 receiver outputs be buffered by single Schmitt input gates or single gates of the HCMOS, ALS, or 74F logic families.

The SN65C1164 and SN75C1154 are low-power BiMOS devices containing four independent drivers and receivers that are used to interface data terminal equipment (DTE) with data circuit-terminating equipment (DCE). These devices are designed to conform to TIA/EIA-232-F. The drivers and receivers of the SN65C1154 and SN75C1154 are similar to those of the SN75C188 quadruple driver and SN75C189A quadruple receiver, respectively. The drivers have a controlled output slew rate that is limited to a maximum of 30 V/µs and the receivers have filters that reject input noise pulses of shorter than 1 µs. Both these features eliminate the need for external components.

The SN65C1154 and SN75C1154 have been designed using low-power techniques in a BiMOS technology. In most applications, the receivers contained in these devices interface to single inputs of peripheral devices such as ACEs, UARTs, or microprocessors. By using sampling, such peripheral devices usually are insensitive to the transition times of the input signals. If this is not the case, or for other uses, it is recommended that the SN65C1154 and SN75C1154 receiver outputs be buffered by single Schmitt input gates or single gates of the HCMOS, ALS, or 74F logic families.

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Documentación técnica

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* Data sheet SN65C1154, SN75C1154 datasheet (Rev. D) 01 abr 2003

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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