TMS470MF06607
- High-Performance Automotive Grade Microcontroller with Safety Features
- Full Automotive Temperature Range
- ECC on Flash and SRAM
- CPU and Memory BIST (Built-In Self Test)
- ARM Cortex™-M3 32-Bit RISC CPU
- Efficient 1.2 DMIPS/MHz
- Optimized Thumb2 Instruction Set
- Memory Protection Unit (MPU)
- Open Architecture With Third-Party Support
- Built-In Debug Module
- Operating Features
- Up to 80MHz System Clock
- Single 3.3V Supply Voltage
- Integrated Memory
- 640KB Total Program Flash with ECC
- Support for Flash EEPROM Emulation
- 64K-Byte Static RAM (SRAM) with ECC
- Key Peripherals
- High-End Timer, MibADC, CAN, MibSPI
- Common TMS470M/570 Platform Architecture
- Consistent Memory Map across the family
- Real-Time Interrupt Timer (RTI)
- Digital Watchdog
- Vectored Interrupt Module (VIM)
- Cyclic Redundancy Checker (CRC)
- Frequency-Modulated Zero-Pin Phase-Locked Loop (FMZPLL)-Based Clock Module
- Oscillator and PLL clock monitor
- Up to 77 Peripheral IO pins
- 8 Dedicated GIO - w/ External Interrupts
- Programmable External Clock (ECLK)
- Communication Interfaces
- Two CAN ControllersOne with 32 mailboxes, one with 16Parity on mailbox RAM
- Two Multi-buffered Serial Peripheral Interface (MibSPI)12 total chip selects64 buffers with parity on eachOne with 4 bit parallel mode
- One Standard SPI Interface4 chip selectsEnable Pin
- Two UART (SCI) interfacesH/W Support for Local Interconnect Network (LIN 2.0)
- High-End Timer (HET)
- Up to 26 Programmable I/O Channels
- 64 Word Instruction RAM with parity
- 10-Bit Multi-Buffered ADCs (MibADC)
- Up to 16 ADC Input channels
- 64 Result FIFO Buffer with parity
- 1.55uS total conversion time
- Calibration and Self Test features
- On-Chip Scan-Base Emulation Logic
- IEEE Standard 1149.1 (JTAG) Test-Access Port and Boundary Scan
- Packages supported
- 144-Pin Plastic Quad Flatpack (PGE Suffix)
- 100-Pin Plastic Quad Flatpack (PZ Suffix)
- Green/Lead-Free
- Development Tools Available
- Development Boards
- Code Composer Studio™ Integrated Development Environment (IDE)
- HET Assembler and Simulator
- nowFlash™ Flash Programming Tool
- Community Reesources
All other trademarks are the property of their respective owners
The TMS470MF06607 device is a member of the Texas Instruments TMS470M family of Automotive Grade 16/32-bit reduced instruction set computer (RISC) microcontrollers. The TMS470M microcontrollers offer high performance utilizing the high efficiency ARM Cortex™-M3 16/32-bit RISC central processing unit (CPU), resulting in a high instruction throughput while maintaining greater code efficiency.
High-end embedded control applications demand more performance from their controllers while maintaining low costs. The TMS470M microcontroller architecture offers solutions to these performance and cost demands while maintaining low power consumption.
The TMS470MF06607 device contains the following:
- 16/32-Bit RISC CPU Core
- 640K-Byte Total Flash with SECDED ECC
- 512K-Byte Program Flash
- 128K- Byte Flash for additional program space or EEPROM Emulation
- 64K-Byte Static RAM (SRAM) with SECDED ECC
- Real-Time Interrupt Timer (RTI)
- Vectored Interrupt Module (VIM)
- Hardware built-in self-test (BIST) checkers for SRAM (MBIST) and CPU (LBIST)
- 64-bit Cyclic Redundancy Checker (CRC)
- Frequency-Modulated Zero-Pin Phase-Locked Loop (FMZPLL)-Based Clock Module With Prescaler
- Two Multi-buffered Serial Peripheral Interfaces (MibSPI)
- Two UARTs (SCI) with Local Interconnect Network Interfaces (LIN)
- Two CAN Controller (DCAN)
- High-End Timer (HET)
- External Clock Prescale (ECP) Module
- One 16-Channel 10-Bit Multi-Buffered ADC (MibADC)
- Error Signaling Module (ESM)
- Four Dedicated General-Purpose I/O (GIO) Pins and 47 (2 of them are muxed with JTAG pins) Additional Peripheral I/Os (100-Pin Package)
The TMS470M memory includes general-purpose SRAM supporting single-cycle read/write accesses in byte, half-word, and word modes. The SRAM on the TMS470M devices can be protected by means of ECC. This feature utilizes a single error correction and double error detection circuit (SECDED circuit) to detect and optionally correct single bit errors as well as detect all dual bit and some multi-bit errors. This is achieved by maintaining an 8-bit ECC checksum/code for each 64-bit double-word of memory space in a separate ECC RAM memory space.
技術文件
設計與開發
電源供應解決方案
為 TMS470MF06607 尋找可用的電源供應解決方案。TI 提供適用於 TI 與非 TI 之系統單晶片 (SoC)、處理器、微控制器、感測器或現場可編程邏輯閘陣列 (FPGA) 的電源供應解決方案。
TMDSEMU200-U — XDS200 USB 偵錯探測器
XDS200 是為 TI 嵌入式裝置偵錯的偵錯探測器 (模擬器)。與低成本 XDS110 和高效能 XDS560v2 相比,XDS200 是兼具低成本與優異效能的完美平衡,可在單一 pod 中支援各種標準 (IEEE1149.1、IEEE1149.7、SWD)。所有 XDS 偵錯探測器均支援具嵌入式追踪緩衝區 (ETB) 的 Arm® 與 DSP 處理器中的核心和系統追蹤功能。透過針腳進行核心追蹤則需要 XDS560v2 PRO TRACE。
XDS200 透過 TI 20 針腳連接器 (配備適用 TI 14 針腳、Arm Cortex® 10 針腳和 Arm 20 針腳的多重轉接器) (...)
TMDSEMU560V2STM-U — XDS560v2 System Trace USB 偵錯探測器
XDS560v2 是 XDS560™ 偵錯探測器系列的最高性能表現,支援傳統 JTAG 標準 (IEEE1149.1) 和 cJTAG (IEEE1149.7)。請注意,序列線偵錯 (SWD) 不受支援。
所有 XDS 偵錯探測器均支援所有具有嵌入式追踪緩衝區 (ETB) 的 ARM 和 DSP 處理器中的核心和系統追蹤功能。對於針腳追蹤則需要 XDS560v2 PRO TRACE。
XDS560v2 透過 MIPI HSPT 60 針腳接頭 (具有用於 TI 14 針腳、TI 20 針腳和 ARM 20 針腳的多轉接器) 連接到目標電路板,並透過 USB2.0 高速 (480Mbps) (...)
TMDSEMU560V2STM-UE — XDS560v2 System Trace USB 與乙太網路偵錯探測器
The XDS560v2 is the highest performance of the XDS560™ family of debug probes and supports both the traditional JTAG standard (IEEE1149.1) and cJTAG (IEEE1149.7). Note that it does not support serial wire debug (SWD).
All XDS debug probes support Core and System Trace in all ARM and DSP processors (...)
CCSTUDIO — Code Composer Studio™ integrated development environment (IDE)
Code Composer Studio is an integrated development environment (IDE) for TI's microcontrollers and processors. It is comprised of a rich suite of tools used to build, debug, analyze and optimize embedded applications. Code Composer Studio is available across Windows®, Linux® and macOS® platforms.
(...)
支援產品和硬體
此設計資源支援此類別中多數產品。
檢查產品詳細資料頁面以確認支援。
-
parametric-filter 數位訊號處理器 (DSP) -
parametric-filter Arm 式處理器 -
parametric-filter MSP430 微控制器 -
parametric-filter C2000 即時微控制器 -
parametric-filter Arm 式微控制器 -
parametric-filter 訊號調節器 -
parametric-filter mmWave 雷達感測器 -
parametric-filter Wi-Fi 產品 -
parametric-filter Sub-1 GHz 產品 -
parametric-filter 數位電源隔離式控制器
HALCOGEN — HAL Code Generator Tool - TMS570 (v4.07.01)
HALCoGen allows users to generate hardware abstraction layer device drivers for Hercules™ microcontrollers. HALCoGen provides a graphical user interface that allows the user to configure peripherals, interrupts, clocks, and other Hercules microcontroller parameters. Once the Hercules device (...)
支援產品和硬體
產品
Arm Cortex-M4 MCU
Arm Cortex-R MCU
軟體
IDE、配置、編譯器或偵錯程式
HET_IDE — 高階計時器 (HET)
F035FLASHAPI — TMS470/570 Platform F035 Flash API (v1.09)
These functions must be used when creating Flash bootloaders or other programming utilities for the TMS470/570 (...)
支援產品和硬體
產品
Arm Cortex-M4 MCU
UNIFLASH — UniFlash for most TI microcontrollers (MCUs) and mmWave sensors
UniFlash is a software tool for programming on-chip flash on TI microcontrollers and wireless connectivity devices and on-board flash for TI processors. UniFlash provides both graphical and command-line interfaces.
UniFlash can be run from the cloud on the TI Developer Zone or downloaded and used (...)
支援產品和硬體
產品
C2000 即時微控制器
Arm 式處理器
工業 mmWave 雷達感測器
汽車 mmWave 雷達感測器
MSP430 微控制器
Wi-Fi 產品
Arm Cortex-M4 MCU
Arm Cortex-M0+ MCU
Arm Cortex-R MCU
低耗電 2.4-GHz 產品
汽車無線連線產品
Sub-1 GHz 無線 MCU
HERCULES_SAFETY_MCU_DEMOS — Hercules Software Kit (v4.0.0)
支援產品和硬體
產品
Arm Cortex-M4 MCU
Arm Cortex-R MCU
NHET-ASSEMBLER — TMS570 NHET Assembler Software (v2.0.1)
TI's Enhanced High-End Timer (NHET) module provides sophisticated timing functions for real-time control applications.
The NHET Assembler translates programs written in the NHET assembly language into multiple output formats for use in code-generation tools such as TI's Code Composer Studio.
支援產品和硬體
產品
Arm Cortex-M4 MCU
Arm Cortex-R MCU
軟體
IDE、配置、編譯器或偵錯程式
NOWECC — TMS570 nowECC v2.22.00
支援產品和硬體
產品
Arm Cortex-M4 MCU
Arm Cortex-R MCU
FMZPLL_CALCULATOR — FMzPLL 配置工具
- OSCIN speed
- multiplier setting
- divider settings
- frequency modulation settings
- PLL/OSC fail options
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
LQFP (PZ) | 100 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點