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TPS7H2140-SEP

現行

耐輻射、4.5-V 至 32-V、輸入 1.35-A 160-mΩ 四通道 eFuse

立即訂購
產品規格表

TPS7H2140-SEP

現行
產品規格表 立即訂購

產品詳細資料

FET Internal Ron (typ) (mΩ) 160 Vin (min) (V) 4.5 Vin (max) (V) 32 Current limit (min) (A) 0.25 Current limit (max) (A) 7 Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Soft start Fixed Features Current monitoring, Thermal shutdown, Under voltage lock out Rating Space Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125 Quiescent current (Iq) (typ) (A) 0.0062 Quiescent current (Iq) (max) (A) 0.0062
FET Internal Ron (typ) (mΩ) 160 Vin (min) (V) 4.5 Vin (max) (V) 32 Current limit (min) (A) 0.25 Current limit (max) (A) 7 Overcurrent response Circuit breaker, Current limiting Fault response Auto-retry Soft start Fixed Features Current monitoring, Thermal shutdown, Under voltage lock out Rating Space Device type eFuses and hot swap controllers Operating temperature range (°C) -55 to 125 Quiescent current (Iq) (typ) (A) 0.0062 Quiescent current (Iq) (max) (A) 0.0062
HTSSOP (PWP) 28 62.08 mm² 9.7 x 6.4
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range
  • Vendor item drawing available, VID V62/23610
  • Total ionizing dose (TID) characterized to 30 krad(Si)
    • RLAT (radiation lot acceptance testing) to 20 krad(Si)
  • Single-event effects (SEE) characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) of 43 MeV-cm 2/mg
    • Single-event transient (SET) and single-event functional interrupt (SEFI) characterized to effective linear energy transfer (LET) of 43 MeV-cm 2/mg
  • Quad-channel 160-mΩ eFuse with full diagnostics and current-sense analog output
  • Wide operating voltage 4.5 V to 32 V
  • Ultra-low standby current < 500 nA
  • High-accuracy current sense: ±15% when I LOAD ≥ 25 mA
  • Adjustable current limit with external resistor (R CL), with accuracy of ±15% when I LOAD ≥ 500 mA
  • Protection
    • Short-to-GND protection by current limit (internal or external)
    • Thermal shutdown with latch off option and thermal swing
    • Inductive load negative voltage clamp with optimized slew rate
    • Loss-of-GND and loss-of-power protection
  • Diagnostics
    • Overcurrent and short-to-ground detection
    • Open-load and short-to-power detection
    • Global fault report for fast interrupt
  • 28-pin thermally-enhanced PWP package
  • Space Enhanced Plastic (SEP)
  • Available in military (–55°C to 125°C) temp range

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.

The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs.

Full diagnostics and high-accuracy current sense enables intelligent control of the loads.

An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.
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類型 標題 日期
* Data sheet TPS7H2140-SEP Radiation-Tolerant 32-V, 160-mΩ Quad-Channel eFuse datasheet (Rev. A) PDF | HTML 2023年 8月 11日
* VID TPS7H2140-SEP VID V62-23610 2024年 5月 1日
* Radiation & reliability report TPS7H2140-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) PDF | HTML 2023年 11月 6日
* Radiation & reliability report TPS7H2140-SEP Neutron Displacement (NDD) Characterization Report PDF | HTML 2023年 10月 10日
* Radiation & reliability report TPS7H2140-SEP Single Event Effects Report PDF | HTML 2023年 10月 9日
* Radiation & reliability report TPS7H2140-SEP Production Flow and Reliability Report PDF | HTML 2023年 10月 4日
Selection guide TI Space Products (Rev. J) 2024年 2月 12日
EVM User's guide TPS7H2140EVM, TPS7H2140-SEP Evaluation Module User's Guide (Rev. A) PDF | HTML 2023年 8月 18日
Certificate TPS7H2140EVM EU Declaration of Conformity (DoC) 2023年 7月 24日
Application note Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products (Rev. A) PDF | HTML 2022年 9月 15日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日

設計與開發

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開發板

TPS7H2140EVM — 適用於耐輻射塑膠四通道 eFuse 的 TPS7H2140-SEP 評估模組

TPS7H2140-SEP 評估模組展示了四通道 eFuse 的運作。該電路板配置為測試平行輸出通道，可以進行自訂以分割輸出通道和/或自訂裝置的其他功能。

使用指南: PDF | HTML
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模擬型號

TPS7H2140-SEP PSpice Transient Model

SLVME15.ZIP (38 KB) - PSpice Model
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計算工具

TVS-RECOMMENDATION-CALC — TVS diode recommendation tool

This tool suggests suitable TVS for given system parameters and abs max voltage rating of the device.
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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封裝 針腳 CAD 符號、佔位空間與 3D 模型
HTSSOP (PWP) 28 Ultra Librarian
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