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UCC57108-Q1

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Controlador de lado bajo de 3 A/3 A con protección contra desaturación y bloqueo de baja tensión de

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UCC57108-Q1

ACTIVO
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Detalles del producto

Number of channels 1 Power switch IGBT, MOSFET, SiCFET Peak output current (A) 3 Input supply voltage (min) (V) 8 Input supply voltage (max) (V) 26 Features Short circuit protection, Soft turn-off, Split output Operating temperature range (°C) -40 to 125 Rise time (ns) 8 Fall time (ns) 14 Channel input logic Non-Inverting Rating Automotive Undervoltage lockout (typ) (V) 8 Driver configuration Single
Number of channels 1 Power switch IGBT, MOSFET, SiCFET Peak output current (A) 3 Input supply voltage (min) (V) 8 Input supply voltage (max) (V) 26 Features Short circuit protection, Soft turn-off, Split output Operating temperature range (°C) -40 to 125 Rise time (ns) 8 Fall time (ns) 14 Channel input logic Non-Inverting Rating Automotive Undervoltage lockout (typ) (V) 8 Driver configuration Single
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Qualified for automotive applications
  • AEC-Q100 qualified
    • Device temperature grade 1
  • Typical 3A sink 3A source output currents
  • DESAT protection with programmable delay
  • Soft turn-off when fault happens
  • Absolute maximum VDD voltage: 30V
  • Input and enable pins capable of withstanding up to –5V
  • Tight UVLO thresholds for bias flexibility
  • Typical 26ns propagation delay
  • Self-protect driver with thermal shutdown function
  • Wide bias voltage range
  • Available in 5mm × 4mm SOIC-8 package
  • Operating junction temperature range of –40°C to 150°C
  • Qualified for automotive applications
  • AEC-Q100 qualified
    • Device temperature grade 1
  • Typical 3A sink 3A source output currents
  • DESAT protection with programmable delay
  • Soft turn-off when fault happens
  • Absolute maximum VDD voltage: 30V
  • Input and enable pins capable of withstanding up to –5V
  • Tight UVLO thresholds for bias flexibility
  • Typical 26ns propagation delay
  • Self-protect driver with thermal shutdown function
  • Wide bias voltage range
  • Available in 5mm × 4mm SOIC-8 package
  • Operating junction temperature range of –40°C to 150°C

The UCC5710x-Q1 is a single channel, high-performance low-side IGBT/SiC gate driver for high power automotive applications such as PTC heaters, traction inverter active discharge circuit, and other auxiliary subsystems. It offers protection features including Under-voltage-lock-out (UVLO), Desaturation protection (DESAT), FAULT report, and thermal shutdown protection. The UCC5710x-Q1 has a typical peak drive strength of 3A and it can handle –5V on its inputs, which improves robustness in systems with moderate ground bouncing. The inputs are independent of supply voltage and can be connected to most controller outputs for maximum control flexibility. Depending on the different pin configuration, the wide voltage range of the bias supply provided in the UCC5710xB-Q1 accommodates bipolar voltage. Also, seperate high and low driver outputs (UCC5710xC-Q1) and an enable function (UCC5710xW-Q1) are provided. An accurate 5V output is available with the UCC5710xB-Q1 and UCC5710xC-Q1.

The UCC5710x-Q1 is a single channel, high-performance low-side IGBT/SiC gate driver for high power automotive applications such as PTC heaters, traction inverter active discharge circuit, and other auxiliary subsystems. It offers protection features including Under-voltage-lock-out (UVLO), Desaturation protection (DESAT), FAULT report, and thermal shutdown protection. The UCC5710x-Q1 has a typical peak drive strength of 3A and it can handle –5V on its inputs, which improves robustness in systems with moderate ground bouncing. The inputs are independent of supply voltage and can be connected to most controller outputs for maximum control flexibility. Depending on the different pin configuration, the wide voltage range of the bias supply provided in the UCC5710xB-Q1 accommodates bipolar voltage. Also, seperate high and low driver outputs (UCC5710xC-Q1) and an enable function (UCC5710xW-Q1) are provided. An accurate 5V output is available with the UCC5710xB-Q1 and UCC5710xC-Q1.

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Documentación técnica

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* Data sheet UCC5710x-Q1 High-Speed, Low-Side Gate Drivers With DESAT Protection For Automotive Applications datasheet (Rev. E) PDF | HTML 31 oct 2024
Application brief Applications and Benefits of UCC5710x-Q1 PDF | HTML 02 ago 2024
Application note Selecting Gate Drivers for HVAC Systems PDF | HTML 04 abr 2024
Application note Review of Different Power Factor Correction (PFC) Topologies' Gate Driver Needs PDF | HTML 22 ene 2024
Application note How to Choose a Gate Driver for DC Motor Drives PDF | HTML 05 oct 2023
Application note Using a Single-Output Gate-Driver for High-Side or Low-Side Drive (Rev. B) PDF | HTML 08 sep 2023
Application brief Designing a Robust Traction Inverter Redundant Power Supply From 800 V Battery (Rev. C) PDF | HTML 16 feb 2023
Application note Benefits of a Compact, Powerful, and Robust Low-Side Gate Driver PDF | HTML 10 nov 2021
Application brief External Gate Resistor Selection Guide (Rev. A) 28 feb 2020
Application brief Understanding Peak IOH and IOL Currents (Rev. A) 28 feb 2020
Application brief Implementing a Bipolar Gate Drive for Low-Side IGBTs and SiC FETs in Motor Drive 10 oct 2019
Application brief How to overcome negative voltage transients on low-side gate drivers' inputs 18 ene 2019

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Placa de evaluación

UCC57108EVM — Módulo de evaluación UCC57108

El UCC57108EVM está diseñado principalmente para evaluar la funcionalidad de UCC57108. El rendimiento del controlador se puede evaluar para cargas capacitivas o dispositivos de potencia con espacios para TO-220. Las placas de evaluación del UCC57108EVM cuentan con conexiones a varios puntos de (...)

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Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
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  • Lugar de fabricación
  • Lugar de ensamblaje

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