Transmission line pulse (TLP) plots test the behavior of a device in the current and time domain during an ESD event. The pulse width and rise time can easily be changed, but typically, the testing involves a rectangular current pulse of 1 to 5-ns rise time and 100-ns pulse width. The TLP plot provides important parameters, the breakdown voltage and the dynamic resistance of the clamp. As mentioned in Section 4.8.6, the clamping voltage can be derived from the TLP plot if the clamping voltage is not explicitly provided in the data sheet. An example is shown from the ESD2CANFD24 data sheet. For this device, looking at 16-A, the clamping voltage is estimated to be 36-V. The device does experience snap-back which is a technique used to reduce the overall voltage drop during an ESD event. Since ESD2CANFD24 is a bi-directional diode, the positive and negative TLP plots are almost identical, this is not the case for uni-directional diodes.

Figure 4-2 Positive TLP Curve

Figure 4-3 Negative TLP Curve