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氮化鎵 (GaN) 功率級

LMG3425R050

現行

具有整合式驅動器、保護、溫度報告和理想二極體模式的 600-V 50-mΩ GaN FET

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產品規格表

LMG3425R050

現行
產品規格表 立即訂購

產品詳細資料

VDS (max) (V) 600 RDS(on) (mΩ) 50 ID (max) (A) 44 Features Bottom-side cooled, Cycle-by-cycle overcurrent protection, Ideal diode mode, Latched overcurrent protection, Overtemperature protection, PWM temperature reporting Rating Catalog Operating temperature range (°C) -40 to 150
VDS (max) (V) 600 RDS(on) (mΩ) 50 ID (max) (A) 44 Features Bottom-side cooled, Cycle-by-cycle overcurrent protection, Ideal diode mode, Latched overcurrent protection, Overtemperature protection, PWM temperature reporting Rating Catalog Operating temperature range (°C) -40 to 150
VQFN (RQZ) 54 144 mm² 12 x 12
  • Qualified for JEDEC JEP180 for hard-switching topologies
  • 600V GaN-on-Si FET with integrated gate driver
    • Integrated high precision gate bias voltage
    • 200V/ns FET hold-off
    • 3.6MHz switching frequency
    • 20V/ns to 150V/ns slew rate for optimization of switching performance and EMI mitigation
    • Operates from 7.5V to 18V supply
  • Robust protection
    • Cycle-by-cycle overcurrent and latched short-circuit protection with < 100ns response
    • Withstands 720V surge while hard-switching
    • Self-protection from internal overtemperature and UVLO monitoring
  • Advanced power management
    • Digital temperature PWM output
    • Ideal diode mode reduces third-quadrant losses
  • Qualified for JEDEC JEP180 for hard-switching topologies
  • 600V GaN-on-Si FET with integrated gate driver
    • Integrated high precision gate bias voltage
    • 200V/ns FET hold-off
    • 3.6MHz switching frequency
    • 20V/ns to 150V/ns slew rate for optimization of switching performance and EMI mitigation
    • Operates from 7.5V to 18V supply
  • Robust protection
    • Cycle-by-cycle overcurrent and latched short-circuit protection with < 100ns response
    • Withstands 720V surge while hard-switching
    • Self-protection from internal overtemperature and UVLO monitoring
  • Advanced power management
    • Digital temperature PWM output
    • Ideal diode mode reduces third-quadrant losses

The LMG3425R050 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.

The LMG3425R050 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance.

Advanced power management features include digital temperature reporting, fault detection, and ideal diode mode. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin. Ideal diode mode reduces third-quadrant losses by enabling dead-time control.

The LMG3425R050 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.

The LMG3425R050 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance.

Advanced power management features include digital temperature reporting, fault detection, and ideal diode mode. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin. Ideal diode mode reduces third-quadrant losses by enabling dead-time control.
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類型 標題 日期
* Data sheet LMG3425R050 600 V 50 mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting datasheet PDF | HTML 2024年 3月 8日
White paper Achieving GaN Products With Lifetime Reliability PDF | HTML 2021年 6月 2日
White paper 結合 TI GaN FETs 與 C2000™ 即時 MCU，實現功率密集與有效率的數位電源系統 2021年 3月 18日
Application note Thermal Performance of QFN12x12 Package for 600V, GaN Power Stage (Rev. A) PDF | HTML 2020年 11月 19日
Technical article How GaN FETs with integrated drivers and self-protection will enable the next gene PDF | HTML 2020年 11月 17日
More literature A Generalized Approach to Determine the Switching Lifetime of a GaN FET 2020年 10月 20日
Analog Design Journal Wide-bandgap semiconductors: Performance and benefits of GaN versus SiC 2020年 9月 22日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

LMG342X-BB-EVM — LMG342x 評估模組

LMG342X-BB-EVM 是一款易於使用的分接板，可當作同步降壓轉換器配置任何 LMG342xR0x0 半橋電路板，例如 LMG3422EVM-043。透過提供功率級、偏壓電源和邏輯電路，此評估模組 (EVM) 可快速測量氮化鎵 (GaN) 裝置切換。此 EVM 能夠提供高達 12A 的輸出電流，運用適當的溫度管理 (強制空氣、低頻運作等)，確保不超過最高操作溫度。EVM 屬於開迴路電路板，不適合執行瞬態量測。

只需要單脈衝寬度調變輸入，具有互補脈衝寬度調變訊號，和板上產生的對應失效時間。使用具有短接地彈簧的示波器探針，提供探針點來測量主要邏輯和功率級波形。

使用指南: PDF | HTML
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子卡

LMG3425EVM-041 — 具有理想二極體模式半橋子板的 LMG3425R050 600-V 50-mΩ

LMG3425EVM-041 配置半橋中兩個 LMG3425R050 GaN FET，具備鎖存過電流防護和所有必要輔助周邊電路。此 EVM 設計旨在與較大的系統配合使用。
使用指南: PDF | HTML
要求
模擬型號

LMG3422R0x0 LMG3425R0x0 LMG3522R030 and LMG3522R030-Q1 PLECS Simulation Model

SNOM768.ZIP (340 KB) - PLECS model
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計算工具

LMGXX-GAN-LLC-CALC — GaN LLC resonant converter device loss calculator

Device Loss Calculator can be used to evaluate different devices for different topologies of the LLC Resonant Converter
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產品
氮化鎵 (GaN) 功率級
LMG2100R026 — 100V 2.6mΩ 半橋氮化鎵 (GaN) 功率級 LMG2100R044 — 具有整合式驅動器和防護功能的 100-V 4.4-mΩ 半橋 GaN FET LMG2610 — 具有整合式驅動器、保護和電流感測功能且適用於 ACF 的 650-V 170/248-mΩ GaN 半橋 LMG2640 — 具有整合式驅動器、防護和電流感測的 650V 105mΩ GaN 半橋 LMG2650 — 具有整合式驅動器、防護和電流感測的 650V 95mΩ GaN 半橋 LMG3410R050 — 具有整合式驅動器和保護功能的 600-V 50-mΩ GaN LMG3410R070 — 具有整合式驅動器和防護的 600V 70mΩ GaN LMG3410R150 — 具有整合驅動器和過電流保護功能的 600-V 150-mΩ GaN LMG3411R050 — 具有整合驅動器和逐週期過電流保護功能的 600V 50mΩ GaN LMG3411R070 — 具有整合驅動器和逐週期過電流保護功能的 600-V 70-mΩ GaN LMG3411R150 — 具有整合驅動器和逐週期過電流保護功能的 600-V 150-mΩ GaN LMG3422R030 — 具有整合式驅動器、防護和溫度報告功能的 600-V 30-mΩ GaN FET LMG3422R050 — 具有整合式驅動器、防護和溫度報告功能的 600-V 50-mΩ GaN FET LMG3425R030 — 具有整合式驅動器、保護、溫度報告和理想二極體模式的 600-V 30-mΩ GaN FET LMG3425R050 — 具有整合式驅動器、保護、溫度報告和理想二極體模式的 600-V 50-mΩ GaN FET LMG3426R030 — 具有整合式驅動器、防護和零電壓偵測的 600V 30mΩ GaN FET LMG3426R050 — 具有整合式驅動器、防護和零電壓偵測的 600V 50mΩ GaN FET LMG3427R030 — 具有整合式驅動器、防護和零電流偵測的 600V 30mΩ GaN FET LMG3522R030 — 具有整合式驅動器、防護和溫度報告功能的 650-V 30-mΩ GaN FET LMG3522R030-Q1 — 具有整合式驅動器、防護和溫度報告功能的車用 650-V、30-mΩ GaN FET LMG3522R050 — 具有整合式驅動器、防護和溫度報告功能的 650-V 50-mΩ GaN FET LMG3526R030 — 具有整合式驅動器、防護和零電壓偵測的 650-V 30-mΩ GaN FET LMG3526R050 — 具有整合式驅動器、防護和零電壓偵測報告的 650-V 50-mΩ GaN FET LMG5200 — 80V GaN 半橋功率級
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