LM76202-Q1
Diodo ideal de 4.2 V a 60 V, 2.2 A e IQ de 300 uA con FET integrado para automoción
LM76202-Q1
- AEC-Q100 qualified for automotive applications
- Temperature grade 1: –40°C ≤ TA ≤ +125°C
- AEC-Q100-012 short circuit reliability Grade A
- HBM ESD classification level 2
- CDM ESD classification level C6
- 4.2-V to 60-V operating voltage, 62-V maximum
- Integrated reverse input polarity protection down to –60-V
- Integrated back-to-back MOSFETs with 150 mΩ total RON
- Transient immunity up-to 65 V
- 0.1-A to 2.23-A adjustable current limit
(±5% accuracy at 1 A) - Load protection during ISO7637 and ISO16750-2 testing
- Short to battery and short to ground protection
- Reverse current blocking for protection from output short to battery
- IMON current indicator output (±8.5% accuracy)
- Low quiescent current (285 µA in operating, 16 µA in shutdown)
- Adjustable UVLO, OVP cut off, inrush current control
- Factory set 38-V overvoltage clamp option
- Selectable current-limiting fault response options (auto-retry, latch off, CB modes)
- Available in easy to use 16-Pin HTSSOP package
The LM76202-Q1 device is a compact, feature-rich 60-V integrated ideal diode with a full suite of protection features. The wide supply input range allows control of 12-V and 24-V automotive battery driven applications. The device withstands and protects the loads from positive and negative supply voltages up to ±60 V. Load, source and device protection are provided with many programmable features including overcurrent, inrush current control, overvoltage and undervoltage thresholds. The internal robust protection control blocks along with the 60-V rating of the device simplifies the system design for ISO standard pulse tesing.
A shutdown pin provides external control for enabling and disabling the internal FETs and places the device in a low current shutdown mode. For system status monitoring and downstream load control, the device provides fault output and precise current monitor output. The MODE pin allows flexibility to configure the device between the three current-limiting fault responses (circuit breaker, latch off, and auto-retry modes). The device monitors V(IN) and V(OUT) to provide reverse current blocking when V(IN) < (V(OUT)-10mV). This function protects system bus from overvoltages during output short to battery faults and also helps in voltage holdup requirements during power fail and brownout conditions.
The device is available in a 5 mm × 4.4 mm 16-pin HTSSOP and is fully specified over a –40°C to +125°C temperature range.
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Documentación técnica
Tipo | Título | Fecha | ||
---|---|---|---|---|
* | Data sheet | LM76202-Q1 60-V, 2.2-A Integrated Ideal Diode with Overvoltage and Overcurrent Protection datasheet (Rev. A) | PDF | HTML | 22 ago 2019 |
Application note | Basics of Ideal Diodes (Rev. B) | PDF | HTML | 05 oct 2021 | |
User guide | LM76202-Q1 Evaluation Module (Rev. B) | 12 dic 2019 | ||
E-book | 11 Ways to Protect Your Power Path | 03 jul 2019 | ||
Application brief | Plug and Play Automotive Protection with Integrated FET Ideal Diode - LM76202-Q1 | 07 jun 2019 | ||
User guide | LM76202-Q1 Evaluation Module | 02 ene 2019 |
Diseño y desarrollo
Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.
LM76202-Q1EVM — Módulo de evaluación LM76202-Q1 de diodo ideal
The LM76202-Q1EVM allows reference circuit evaluation of TI's LM76202-Q1 and LM74202-Q1 ideal diodes. The LM76202-Q1 device is 4.5 V to 60 V, 2.23-A ideal diode and the LM74202-Q1 device is 4.5 V to 40 V, 2.23-A ideal diode. Both devices have reverse battery protection, overvoltage, (...)
PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI
Encapsulado | Pines | Símbolos CAD, huellas y modelos 3D |
---|---|---|
HTSSOP (PWP) | 16 | Ultra Librarian |
Pedidos y calidad
- RoHS
- REACH
- Marcado del dispositivo
- Acabado de plomo/material de la bola
- Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
- Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
- Contenido del material
- Resumen de calificaciones
- Monitoreo continuo de confiabilidad
- Lugar de fabricación
- Lugar de ensamblaje
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