TLC2543-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of -40°C to 125°C (TLC2543Q) and -55°C to 125°C (TLC2543M)
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product Change Notification
- Qualification Pedigree(1)
- 12-Bit-Resolution Analog-to-Digital Converter (ADC)
- 10-µs Conversion Time Over Operating Temperature
- 11 Analog Input Channels
- Three Built-In Self-Test Modes
- Inherent Sample-and-Hold Function
- Linearity Error . . . ±1 LSB Max
- On-Chip System Clock
- End-of-Conversion (EOC) Output
- Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
- Programmable Most Significant Bit (MSB) or Least Significant Bit (LSB) First
- Programmable Power Down
- Programmable Output Data Length
- CMOS Technology
- Application Report Available(2)
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converter (ADC). This device, with three control inputs [chip select (CS), input-output clock (I/O CLOCK), and address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.
In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any 1 of 11 inputs or any 1 of 3 internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TLC2543-EP datasheet (Rev. A) | 2006年 11月 2日 | |
* | VID | TLC2543-EP VID V6203614 | 2016年 6月 21日 | |
* | Radiation & reliability report | TLC2543MDBREP Reliability Report | 2016年 2月 16日 | |
* | Radiation & reliability report | TLC2543QDWREP Reliability Report | 2014年 12月 22日 | |
E-book | Best of Baker's Best: Precision Data Converters -- SAR ADCs | 2015年 5月 21日 | ||
Application note | Determining Minimum Acquisition Times for SAR ADCs, part 2 | 2011年 3月 17日 |
設計與開發
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ANALOG-ENGINEER-CALC — 類比工程師計算機
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOIC (DW) | 20 | Ultra Librarian |
SSOP (DB) | 20 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點