ADS61B29
- Integrated High Impedance Analog Input Buffer
- Maximum Sample Rate: 250 MSPS
- 14-Bit Resolution — ADS61B49
- 12-Bit Resolution — ADS61B29
- 790 mW Total Power Dissipation at 250 MSPS
- Double Data Rate (DDR) LVDS and Parallel CMOS Output Options
- Programmable Fine Gain up to 6 dB for SNR/SFDR Trade-Off and 1-Vpp Full-Scale Operation
- DC Offset Correction
- Supports Input Clock Amplitude Down to 400 mVPP Differential
- 48-QFN Package (7mm × 7mm)
- Pin Compatible with ADS6149 Family
- APPLICATIONS
- Multicarrier, Wide Bandwidth Communications
- Wireless Multi-Carrier Communications Infrastructure
- Software Defined Radio
- Power Amplifier Linearization Feedback ADC
- 802.16d/e
- Test and Measurement Instrumentation
- High Definition Video
- Medical Imaging
- Radar Systems
The ADS61B49 (ADS61B29) is a 14-bit (12-bit) A/D converter with a sampling rate up to 250 MSPS. It combines high dynamic performance and low power consumption in a compact 48-QFN package. An integrated analog buffer makes it well-suited for multi-carrier, wide bandwidth communications applications. The buffer maintains constant performance and input impedance across a wide frequency range.
The ADS61B49 (ADS61B29) has fine gain options that can be used to improve SFDR performance at lower full-scale input ranges. It includes a dc offset correction loop that can be used to cancel the ADC offset. Both Double Data Rate (DDR) LVDS and parallel CMOS digital output interfaces are available. At lower sampling rates, the ADC automatically operates at scaled down power with no loss in performance.
It includes internal references while the traditional reference pins and associated decoupling capacitors have been eliminated. The device is specified over the industrial temperature range (-40°C to 85°C).
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | 14-/12-Bit, 250-MSPS ADCs with Integrated Analog Input Buffer datasheet (Rev. B) | 2009年 5月 13日 | |
Application note | Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A) | 2015年 5月 22日 | ||
Application note | Why Use Oversampling when Undersampling Can Do the Job? (Rev. A) | 2013年 7月 19日 | ||
Application note | Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A) | 2010年 9月 10日 | ||
EVM User's guide | ADS61x9/55xxEVM User's Guide (Rev B of the EVM board) (Rev. A) | 2009年 6月 11日 | ||
Application note | Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio | 2009年 4月 28日 | ||
Application note | CDCE62005 as Clock Solution for High-Speed ADCs | 2008年 9月 4日 | ||
Application note | CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters | 2008年 6月 8日 | ||
Application note | Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 | 2008年 6月 2日 | ||
Application note | QFN Layout Guidelines | 2006年 7月 28日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
ANALOG-ENGINEER-CALC — PC software analog engineer's calculator
The analog engineer’s calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis. This PC-based tool provides a graphical interface with a list of various common calculations ranging from setting operational-amplifier (...)
支援產品和硬體
產品
精密度運算放大器 (Vos<1mV)
一般用途運算放大器
音訊運算放大器
轉阻放大器
高速運算放大器 (GBW ≥ 50 MHz)
功率運算放大器
視訊放大器
線路驅動器
轉導放大器與雷射驅動器
全差分放大器
精確 ADC
生物感測 AFE
高速 ADC (≥10 MSPS)
觸控式螢幕控制器
差分放大器
儀器放大器
音訊線路接收器
類比電流感測放大器
數位電源監測器
配備整合式分流電阻器的類比電流感測放大器
具整合式分流電阻器的數位電源監測器
晶粒與晶圓服務
RF 接收器
RF 發射器
JITTER-SNR-CALC — Jitter and SNR calculator
JITTER-SNR-CALC can be used for calculating theoretical Signal to Noise (SNR) performance of ADCs based on input frequency and clock jitter.
支援產品和硬體
產品
高速 ADC (≥10 MSPS)
精確 ADC
SBAC119 — TIGAR (Texas Instruments Graphical Evaluation of ADC Response Tool)
支援產品和硬體
產品
高速 ADC (≥10 MSPS)
RF 接收器
硬體開發
開發板
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
VQFN (RGZ) | 48 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。